K7P323666M-H(G)C30 查看數據表（PDF） - Samsung
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K7P323666M-H(G)C30 Datasheet PDF : 14 Pages
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K7P323666M
K7P321866M
1Mx36 & 2Mx18 SRAM
IEEE 1149.1 TEST ACCESS PORT AND BOUNDARY SCAN-JTAG
This part contains an IEEE standard 1149.1 Compatible Teat Access Port(TAP). The package pads are monitored by the Serial Scan
circuitry when in test mode. This is to support connectivity testing during manufacturing and system diagnostics. Internal data is not
driven out of the SRAM under JTAG control. In conformance with IEEE 1149.1, the SRAM contains a TAP controller, Instruction Reg-
ister, Bypass Register and ID register. The TAP controller has a standard 16-state machine that resets internally upon power-up,
therefore, TRST signal is not required. It is possible to use this device without utilizing the TAP. To disable the TAP controller without
interfacing with normal operation of the SRAM, TCK must be tied to VSS to preclude mid level input. TMS and TDI are designed so an
undriven input will produce a response identical to the application of a logic 1, and may be left unconnected. But they may also be
tied to VDD through a resistor. TDO should be left unconnected.
JTAG Block Diagram
M1
TDI
TMS
TCK
SRAM
CORE
BYPASS Reg.
Identification Reg.
Instruction Reg.
Control Signals
TAP Controller
M2
TDO
JTAG Instruction Coding
IR2 IR1 IR0 Instruction
TDO Output
Notes
0 0 0 SAMPLE-Z Boundary Scan Register 1
0 0 1 IDCODE Identification Register
2
0 1 0 SAMPLE-Z Boundary Scan Register 1
0 1 1 BYPASS Bypass Register
3
1 0 0 SAMPLE Boundary Scan Register 4
1 0 1 PRIVATE
5
1 1 0 BYPASS Bypass Register
3
1 1 1 BYPASS Bypass Register
3
NOTE :
1. Places DQs in Hi-Z in order to sample all input data regardless of
other SRAM inputs.
2. TDI is sampled as an input to the first ID register to allow for the serial
shift of the external TDI data.
3. Bypass register is initiated to VSS when BYPASS instruction is
invoked. The Bypass Register also holds serially loaded TDI when
exiting the Shift DR states.
4. SAMPLE instruction dose not places DQs in Hi-Z.
5. PRIVATE is reserved for the exclusive use of SAMSUNG. This
instruction should not be used.
TAP Controller State Diagram
1 Test Logic Reset
0
1
0
Run Test Idle
1
1
1
Select DR
0
Capture DR
0
Shift DR
1
Exit1 DR
0
Pause DR
1
Exit2 DR
1
Update DR
0
1
1
0
1
0
0
1
Select IR
0
Capture IR
0
Shift IR
0
1
Exit1 IR
0
Pause IR
0
1
0
Exit2 IR
1
0
Update IR
1
- 11
Dec. 2005
Rev 1.2
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