74F2952 查看數據表（PDF） - Philips Electronics

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74F2952

74F2952 Registered transceiver, non-inverting (3-State) 74F2953 Registered transceiver, inverting (3-State)

Philips Electronics 

Philips Semiconductors

Transceivers

Product specification

74F2952, 74F2953

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

±10% VCC 2.4

V

VOH

High-level output voltage

A0–A7

VCC = MIN,

VIL = MAX,

IOH = –3mA ±5% VCC

2.7

3.3

B0–B7

VIH = MIN

±10% VCC 2.0

IOH = –15mA ±5% VCC

2.0

V

V

V

VOL

Low-level output voltage

A0–A7

B0–B7

VCC = MIN,

VIL = MAX,

VIH = MIN

IOL = 24mA

IOL = 48mA

IOL = 64mA

±10% VCC

±5% VCC

±10% VCC

±5% VCC

0.35 0.50

V

0.35 0.50

V

0.38 0.55

V

0.42 0.55

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73 –1.2

V

CPAB, CPBA,

II

Input current at maximum

input voltage

OEAB, OEBA, VCC = 5.5V, VI = 7.0V

CEAB, CEBA

A0–A7,

B0–B7

VCC = 5.5V, VI = 5.5V

100

µA

1

mA

CPAB, CPBA,

IIH

High-level input current

OEAB, OEBA, VCC = MAX, VI = 2.7V

CEAB, CEBA

20

µA

CPAB, CPBA,

IIL

Low-level input current

OEAB, OEBA, VCC = MAX, VI = 0.5V

CEAB, CEBA

–0.6 mA

IIH+IOZH

Off-state output current

High-level voltage applied

A0–A7,

B0–B7

VCC = MAX, VO = 2.7V

70

µA

IIL+IOZL

Off-state output current

Low-level voltage applied

A0–A7,

B0–B7

VCC = MAX, VO = 0.5V

–600 µA

A0–A7

IOS

Short-circuit output current3

B0–B7

VCC = MAX, VO = 0V

–60

–100

–150 mA

–225 mA

ICCH

90

140

mA

ICC

Supply current (total)

iCCL

VCC = MAX

120 175 mA

ICCZ

105 155 mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1989 Sep 22

7

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