LTC1287BCJ 查看數據表（PDF） - Linear Technology

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LTC1287BCJ

Single Chip 12-Bit Data Acquisition System

Linear Technology 

LTC1287

AC CHARACTERISTICS (Note 3)

SYMBOL

thDO

tf

tr

tWHCLK

tWLCLK

tsuCS

tWHCS

tWLCS

CIN

PARAMETER

Time Output Data Remains Valid After CLK↓

DOUT Fall Time

DOUT Rise Time

CLK High Time

CLK Low Time

Setup Time, CS↓ Before CLK↑

CS High Time Between Data Transfer Cycles

CS Low Time During Data Transfer

Input Capacitance

CONDITIONS

See Test Circuits

See Test Circuits

VCC = 3V (Note 6)

VCC = 3V (Note 6)

VCC = 3V (Note 6)

VCC = 3V (Note 6)

VCC = 3V (Note 6)

Analog Inputs On Channel

Analog Inputs Off Channel

Digital Inputs

LTC1287B/LTC1287C

MIN TYP MAX

UNITS

50

ns

q

40 100

ns

q

40 100

ns

600

ns

800

ns

100

ns

5.0

µs

14

CLK Cycles

100

pF

5

pF

5

pF

DIGITAL A D DC ELECTRICAL CHARACTERISTICS (Note 3)

SYMBOL PARAMETER

CONDITIONS

LTC1287B/LTC1287C

MIN TYP MAX

UNITS

VIH

High Level Input Voltage

VIL

Low Level Input Voltage

IIH

High Level Input Current

IIL

Low Level Input Current

VOH

High Level Output Voltage

VOL

Low Level Output Voltage

IOZ

High Z Output Leakage

ISOURCE

ISINK

ICC

IREF

Output Source Current

Output Sink Current

Positive Supply Current

Reference Current

VCC = 3.6V

VCC = 3.0V

VIN = VCC

VIN = 0V

VCC = 3.0V, IO = 20µA

IO = 400µA

VCC = 3.0V, IO = 20µA

IO = 400µA

VOUT = VCC, CS High

VOUT = 0V, CS High

VOUT = 0V

VOUT = VCC

CS High

VREF = 2.5V

q

2.1

V

q

0.45

V

q

2.5

µA

q

– 2.5

µA

2.90

V

q

2.7 2.85

V

0.05

V

q

0.10 0.3

V

q

3

µA

q

–3

µA

–10

mA

9

mA

q

1.5 5

mA

q

10 50

µA

The q denotes specifications which apply over the operating temperature

range; all other limits and typicals TA = 25°C.

Note 1: Absolute Maximum Ratings are those values beyond which the life

of a device may be impaired.

Note 2: All voltage values are with respect to ground (unless otherwise

noted).

Note 3: VCC = 3V, VREF = 2.5V, CLK = 500kHz unless otherwise specified.

Note 4: One LSB is equal to VREF divided by 4096. For example, when VREF

= 2.5V, 1LSB = 2.5V/4096 = 0.61mV.

Note 5: Integral nonlinearity error is defined as the deviation of a code

from a straight line passing through the actual endpoints of the transfer

curve. The deviation is measured from the center of the quantization band.

Note 6: Recommended operating conditions.

Note 7: Two on-chip diodes are tied to each analog input which will

conduct for analog voltages one diode drop below GND or one diode drop

above VCC. Be careful during testing at low VCC levels, as high level analog

inputs can cause this input diode to conduct, especially at elevated

temperature, and cause errors for inputs near full scale. This spec allows

50mV forward bias of either diode. This means that as long as the analog

input does not exceed the supply voltage by more than 50mV, the output

code will be correct.

Note 8: Channel leakage current is measured after the channel selection.

Note 9: Increased leakage currents at elevated temperatures cause the S/

H to droop, therefore it is recommended that fCLK ≥ 30kHz at 85°C and

fCLK ≥ 3kHz at 25°C.

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