LTC1415I 查看數據表（PDF） - Linear Technology

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LTC1415I

12-Bit, 1.25Msps, 55mW Sampling A/D Converter

Linear Technology 

LTC1415

APPLICATIONS INFORMATION

CONVERSION DETAILS

The LTC1415 uses a successive approximation algorithm

and an internal sample-and-hold circuit to convert an

analog signal to a 12-bit parallel output. The ADC is

complete with a precision reference and an internal clock.

The control logic provides easy interface to microproces-

sors and DSPs (please refer to Digital Interface section for

the data format).

Conversion start is controlled by the CS and CONVST

inputs. At the start of the conversion the successive

approximation register (SAR) is reset. Once a conversion

cycle has begun it cannot be restarted.

During the conversion, the internal differential 12-bit

capacitive DAC output is sequenced by the SAR from the

most significant bit (MSB) to the least significant bit (LSB).

Referring to Figure 1, the +AIN and –AIN inputs are con-

nected to the sample-and-hold capacitors (CSAMPLE) dur-

ing the acquire phase and the comparator offset is nulled by

the zeroing switches. In this acquire phase, a minimum

delay of 150ns will provide enough time for the sample-

and-hold capacitors to acquire the analog signal. During

the convert phase the comparator zeroing switches open,

putting the comparator into compare mode. The input

switches the connect CSAMPLE capacitors to ground, trans-

ferring the differential analog input charge onto the sum-

ming junction. This input charge is successively compared

SAMPLE

+AIN

SAMPLE

–AIN

+CSAMPLE

HOLD

– CSAMPLE

HOLD

+CDAC

+VDAC

–CDAC

ZEROING SWITCHES

HOLD

HOLD

+

COMP

–

–VDAC

12

SAR

OUTPUT

LATCHES

•••

D11

D0

LTC1415 • F01

Figure 1. Simplified Block Diagram

with the binary weighted charges supplied by the differen-

tial capacitive DAC. Bit decisions are made by the high

speed comparator. At the end of a conversion, the differ-

ential DAC output balances the + AIN and – AIN input

charges. The SAR contents (a 12-bit data word) which

represents the difference of + AIN and – AIN are loaded into

the 12-bit output latches.

DYNAMIC PERFORMANCE

The LTC1415 has excellent high speed sampling capabil-

ity. FFT (Fast Fourier Transform) test techniques are used

to test the ADC’s frequency response, distortion and noise

at the rated throughput. By applying a low distortion sine

wave and analyzing the digital output using a FFT algo-

rithm, the ADC’s spectral content can be examined for

frequencies outside the fundamental. Figure 2 shows a

typical LTC1415 FFT plot.

0

fSAMPLE = 1.25MHz

–20

fIN = 99.792kHz

SFDR - 87.5

SINAD = 72.1

–40

–60

–80

–100

–120

0

100 200 300 400 500 600

FREQUENCY (kHz)

LTC1415 • F02

Figure 2. LTC1415 Nonaveraged, 4096 Point FFT

Signal-to-Noise Ratio

The signal-to-noise plus distortion ratio [S/(N + D)] or

SINAD is the ratio between the RMS amplitude of the

fundamental input frequency to the RMS amplitude of all

other frequency components at the A/D output. The output

is band limited to frequencies from above DC and below

half the sampling frequency. Figure 2 shows a typical

spectral content with a 1.25MHz sampling rate and a

100kHz input. The dynamic performance is excellent for

input frequencies up to the Nyquist limit of 625kHz.

8

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