L8575 查看數據表（PDF） - Agere -> LSI Corporation
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L8575 Datasheet PDF : 36 Pages
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L8575
Dual-Resistive, Low-Cost SLIC
Advance Data Sheet
March 1997
Absolute Maximum Ratings (@ TA = 25 °C)
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational sections of this data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
Parameter
5 V Analog dc Supply
5 V Digital dc Supply
Office Battery Supply
Logic Input Voltage
Logic Input Clamp Diode Current, per Pin
Logic Output Voltage
Logic Output Current, per Pin (excluding relay drivers)
Maximum Junction Temperature
Operating Temperature Range
Storage Temperature Range
Relative Humidity Range
Ground Potential Difference (DGND to AGND)
Symbol
VDDA
VDDD
VBAT
—
—
—
—
—
—
Tstg
—
—
Min
–0.5
–0.5
–65
–0.5
—
–0.5
—
—
–40
–40
5
+0.5
Value
—
—
—
—
±20
—
±35
150
—
—
—
—
Max
+7.0
+7.0
+0.5
VDDD + 0.5
—
VDDD + 0.5
—
—
+125
+125
95
–0.5
Unit
V
V
V
V
mA
V
mA
°C
°C
°C
%
V
Notes:
Analog and battery voltages are referenced to AGND; digital (logic) voltages are referenced to DGND.
The IC can be damaged unless all ground connections are applied before, and removed after, all other connections. Furthermore, when power-
ing the device, the user must guarantee that no external potential creates a voltage on any pin of the device that exceeds the device ratings.
Some of the known examples of conditions that cause such potentials during powering are (1) an inductor connected to Tip and Ring that can
force an overvoltage on VBAT through external components if the VBAT connection chatters, and (2) inductance in the VBAT lead that could reso-
nate with the VBAT filter capacitor to cause a destructive overvoltage.
8
Lucent Technologies Inc.
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