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M27V256 查看數據表(PDF) - STMicroelectronics

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M27V256 Datasheet PDF : 15 Pages
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M27V256
Table 5. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
High Speed
10ns
0 to 3V
1.5V
Standard
20ns
0.4V to 2.4V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
Figure 4. AC Testing Load Circuit
High Speed
3V
0V
1.5V
1.3V
1N914
3.3k
Standard
t(s) 2.4V
Produc 0.4V
2.0V
0.8V
AI01822
DEVICE
UNDER
TEST
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
AI01823B
olete Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz)
s Symbol
Parameter
Ob CIN
Input Capacitance
- COUT Output Capacitance
t(s) Note: 1. Sampled only, not 100% tested.
uc DEVICE OPERATION
d The modes of operation of the M27V256 are listed
ro in the Operating Modes. A single power supply is
required in the read mode. All inputs are TTL lev-
P els except for VPP and 12V on A9 for Electronic
te Signature.
le Read Mode
o The M27V256 has two control functions, both of
s which must be logically active in order to obtain
bdata at the outputs. Chip Enable (E) is the power
Ocontrol and should be used for device selection.
Test Condition
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
dresses are stable, the address access time
(tAVQV) is equal to the delay from E to output
(tELQV). Data is available at the output after delay
of tGLQV from the falling edge of G, assuming that
E has been low and the addresses have been sta-
ble for at least tAVQV-tGLQV.
Standby Mode
The M27V256 has a standby mode which reduces
the supply current from 10mA to 10µA with low
voltage operation VCC 3.6V, see Read Mode DC
Characteristics table for details. The M27V256 is
Output Enable (G) is the output control and should placed in the standby mode by applying a CMOS
be used to gate data to the output pins, indepen- high signal to the E input. When in the standby
dent of device selection. Assuming that the ad- mode, the outputs are in a high impedance state,
independent of the G input.
4/15

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