DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

M48Z129VPM 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
M48Z129VPM
ST-Microelectronics
STMicroelectronics ST-Microelectronics
M48Z129VPM Datasheet PDF : 13 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
M48Z129Y, M48Z129V
Table 7. Power Down/Up Trip Points DC Characteristics (1)
(TA = 0 to 70 °C)
Symbol
Parameter
Min
Power-fail Deselect Voltage (M48Z129Y)
4.2
VPFD
Power-fail Deselect Voltage (M48Z129V)
2.7
Battery Back-up Switchover Voltage (M48Z129Y)
VSO
Battery Back-up Switchover Voltage (M48Z129V)
tDR (2) Expected Data Retention Time
10
Note: 1. All voltages referenced to VSS.
2. At 25 °C.
Typ
4.35
2.9
3.0
2.45
Max
Unit
4.5
V
3.0
V
YEARS
Table 8. Power Down/Up AC Characteristics
(TA = 0 to 70 °C)
Symbol
Parameter
Min
Max
Unit
tF (1)
VPFD (max) to VPFD (min) VCC Fall Time
300
µs
tFB (2)
VPFD (min) to VSS VCC Fall Time (M48Z129Y)
VPFD (min) to VSS VCC Fall Time (M48Z129V)
10
µs
150
tR
VPFD (min) to VPFD (max) VCC Rise Time
10
µs
tRB
tWPT
VSS to VPFD (min) VCC Rise Time
Write Protect Time (M48Z129Y)
Write Protect Time (M48Z129V)
1
µs
40
150
µs
40
250
tREC
VPFD (max) to RST High
40
200
ms
Note: 1. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/write protection not occurring until 200µs after VCC pass-
es VPFD (min).
2. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
6/13

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]