QL4058-2PQ208C 查看數據表（PDF） - QuickLogic Corporation

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QL4058-2PQ208C

8,000 Usable PLD Gate QuickRAM ESP Combining Performance, Density and Embedded RAM

QuickLogic Corporation 

QL4058 QuickRAM Data Sheet Rev H

[8:0]

[17:0]

[1:0]

WA

RE

WD

WE

WCL K

MOD E

RCLK

[8:0]

RA

[17:0]

RD

ASYNCRD

Figure 4: QuickRAM Module

Symbol

tSWA

tHWA

tSWD

tHWD

tSWE

tHWE

tWCRD

Table 2: RAM Cell Synchronous Write Timing

Parameter

Propagation Delays (ns)

Fanout

1

2

3

4

5

WA Setup Time to WCLK

1.0 1.0 1.0 1.0 1.0

WA Hold Time to WCLK

0.0 0.0 0.0 0.0 0.0

WD Setup Time to WCLK

1.0 1.0 1.0 1.0 1.0

WD Hold Time to WCLK

0.0 0.0 0.0 0.0 0.0

WE Setup Time to WCLK

1.0 1.0 1.0 1.0 1.0

WE Hold Time to WCLK

0.0 0.0 0.0 0.0 0.0

WCLK to RD (WA=RA)a

5.0 5.3 5.6 5.9 7.1

a. Stated timing for worst case Propagation Delay over process variation at VCC = 3.3 V and

TA = 25°C. Multiply by the appropriate Delay Factor, K, for speed grade, voltage and temperature

settings as specified in the Operating Range.

Symbol

Logic Cells

tSRA

tHRA

tSRE

tHRE

tRCRD

Table 3: RAM Cell Synchronous Read Timing

Parameter

Propagation Delays (ns)

Fanout

1

2

3

4

5

RA Setup Time to RCLK

1.0 1.0 1.0 1.0 1.0

RA Hold Time to RCLK

0.0 0.0 0.0 0.0 0.0

RE Setup Time to RCLK

1.0 1.0 1.0 1.0 1.0

RE Hold Time to RCLK

0.0 0.0 0.0 0.0 0.0

RCLK to RDa

4.0 4.3 4.6 4.9 6.1

a. Stated timing for worst case Propagation Delay over process variation at VCC = 3.3 V and

TA = 25°C. Multiply by the appropriate Delay Factor, K, for speed grade, voltage and temperature

settings as specified in the Operating Range.

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