DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

M58LW064 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
M58LW064 Datasheet PDF : 53 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
M58LW064A, M58LW064B
DEVICE OPERATIONS
See Tables 5, 6, 7 and 10.
Address Latch. An address is latched on the ris-
ing edge of the Latch Enable L input for Asynchro-
nous Latch Enable Controlled Read. For
Asynchrouns Latch Enable Controlled Write, the
address is latched on the rising edge of Chip En-
able E, Write Enable W or Latch Enable L, which-
ever occurs first.
For Synchronous Burst Read the address is
latched on the first valid Burst Clock K edge when
Latch Enable L is at Low, or on the rising edge of
Latch Enable L, whichever occurs first.
Asynchronous Random Read. Asynchronous
Random Read outputs the contents of the Array.
Both Chip Enable E and Output Enable G must be
Low in order to read the output of the memory.
By first writing the appropriate Instruction, the
Electronic Signature (RSIG), the Status Register
(RSR), the Read Query Instruction (RCFI) or the
Block Protection Status (RSIG) can be read.
Asynchronous Random Read is the default read
mode which the device enters on power-up or on
return from Reset/Power-down.
Asynchronous Page Read. Asynchronous
Page Read may be used for Random or Latch En-
able Controlled Reads of the Array, which are per-
formed independent of the Burst Clock signal. A
page has a size of 4 Words or 2 Double-Words
and is addressed by the address inputs A1 and A2
in the x16, or A2 only in the x32 organisation. Data
is read internally and stored in the Page Buffer.
The page read starts when both Chip Enable E
and Output Enable G are Low. The first data is in-
ternally read and is output after the normal access
time tAVQV. Successive Words or Double-Words
can be read with a much reduced access time of
tAVQV1 by changing only the low address bits.
Synchronous Burst Read. The memory sup-
ports different types of burst access using a Burst
Configuration Register to configure the burst type,
length and latency.
In continuous burst read, one burst read operation
can access the entire memory sequentially by
keeping the Burst Address Advance B Low for the
appropriate number of clock cycles. At the end of
the memory address space the burst read restarts
from the beginning at address 000000h.
Synchronous Burst Read is activated when the
Burst Clock K input is clocking and Chip Enable E
is Low. The burst start address is latched and
loaded into the internal Burst Address Counter on
the valid Burst Clock K edge (rising or falling de-
pending on the M6 bit value for the Burst Clock
Edge Configuration in the Burst Configuration
Register) when Latch Enable L is Low, or upon the
rising edge of Latch Enable L when the Burst
Clock K is valid. After an initial memory latency
time, the memory outputs data each clock cycle
(or two clock cycles depending on M9 bit value de-
fined in the Burst Configuration Register). The
Burst Address Advance B input controls the mem-
ory burst output. The second burst output is on the
next clock valid edge after the Burst Address Ad-
vance B has been pulled Low.
The Valid Data Ready output signal R monitors if
the memory burst boundary is exceeded and the
Burst Controller of the microprocessor needs to in-
sert wait states. When Valid Data Ready R is Low
on the active clock edge, no new data is available
and the memory does not increment the internal
address counter at the active clock edge even if
Burst Address Advance B is Low.
Synchronous Burst Read will be suspended when
Burst Address Advance B is High. The Valid Data
Ready signal R may be configured (by bit M8 of
Burst Configuration Register) to be valid immedi-
ately at the valid clock edge or one data cycle be-
fore the valid clock edge.
To increase the data throughput the device has
been built with an internal pipelined architecture
allowing the user to enter a burst read input com-
mand and the next starting address location to be
read while the device is filling the output data bus
with its current burst content. This pipelined struc-
ture is intended to produce no wait-states on the
output data bus for successive burst read mode
operations.
Asynchronous and Latch Enable Controlled
Write. Asynchronous Write is used to give com-
mands to the Command Interface for Instructions
to the memory or to latch addresses and input data
to be programmed. To perform any Instruction the
Command Interface is activated starting with a
write cycle. A write cycle is also required give the
Instruction to clear the Status Register informa-
tion. Two write cycles are needed to define the
Block Erase and the Write to Buffer and Program
Instructions. The first write cycle defines the In-
struction selection and the second indicates the
appropriate block address to be erased for the
Block Erase instruction, or the address locations to
program with the number of Words or Double-
Words in the Write to Buffer and Program Instruc-
tion.
An Asynchronous Write is initiated when Chip En-
able E, Write Enable W and Latch Enable L are
Low with Output Enable G High. Commands and
Input Data are latched on the rising edge of Chip
Enable E or Write Enable W, whichever occurs
first. For an Asynchronous Latch Enable Con-
trolled Write the address is latched on the rising
edge of Latch Enable L, Write Enable W or Chip
Enable E, whichever occurs first.
12/53

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]