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MAC8SMG 查看數據表(PDF) - ON Semiconductor

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MAC8SMG Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
MAC8SD, MAC8SM, MAC8SN
350
300
300
VPK = 400 V
250
600 V
200
800 V
150
RG − MT1 = 510 W
100
50
100
105
110
TJ, Junction Temperature (°C)
Figure 13. Typical Exponential Static dv/dt Versus
Junction Temperature, MT2(−)
VPK = 400 V
250
600 V
200
800 V
150
TJ = 110°C
100
100 200
300 400 500 600 700 800
RGK, GATE−MT1 RESISTANCE (OHMS)
900 1000
Figure 14. Typical Exponential Static dv/dt Versus
Gate−MT1 Resistance, MT2(−)
100
VPK = 400 V
90°C
10
tw
VDRM
1
f = 2 tw
(di/dt)c =
6f ITM
1000
110°C
100°C
1
1
5
10
15
20
25
30
(di/dt)c, CRITICAL RATE OF CHANGE OF COMMUTATING CURRENT (A/ms)
Figure 15. Critical Rate of Rise of
Commutating Voltage
200 VRMS
ADJUST FOR
ITM, 60 Hz VAC
TRIGGER
CHARGE
CHARGE
CONTROL
NON-POLAR
CL
LL
MEASURE
I
RS
1N4007
CS
MT2
1N914 51 W
MT1
G
ADJUST FOR +
di/dt(c)
200 V
Note: Component values are for verification of rated (di/dt)c. See AN1048 for additional information.
Figure 16. Simplified Test Circuit to Measure the Critical Rate of Rise of Commutating Current (di/dt)c
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