MAX6900ETT 查看數據表（PDF） - Maxim Integrated

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MAX6900ETT

PLASTIC ENCAPSULATED DEVICES

Maxim Integrated 

V. Quality Assurance Information

A. Quality Assurance Contacts:

Jim Pedicord (Reliability Lab Manager)

Bryan Preeshl (Executive Director of QA)

Kenneth Huening (Vice President)

B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.

0.1% For all Visual Defects.

C. Observed Outgoing Defect Rate: < 50 ppm

D. Sampling Plan: Mil-Std-105D

VI. Reliability Evaluation

A. Accelerated Life Test

The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure

Rate (λ) is calculated as follows:

λ= 1 =

1.83

(Chi square value for MTTF upper limit)

MTTF 192 x 4389 x 160 x 2

Thermal acceleration factor assuming a 0.8eV activation energy

λ = 6.79 x 10-9

λ= 6.79 F.I.T. (60% confidence level @ 25°C)

This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.

Maxim also performs weekly Burn-In on samples from production to assure the reliability of its processes. The

reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates

to 3 failures in an 80 piece sample. The Burn-In Schematic #06-5635 shows the static circuit used for this test

Maxim performs failure analysis on lots exceeding this level. Maxim also performs 1000 hour life test monitors

quarterly for each process. This data is published in the Product Reliability Report (RR-1M).

B. Moisture Resistance Tests

Maxim evaluates pressure pot stress from every assembly process during qualification of each new

design. Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard

85°C/85%RH or HAST tests are performed quarterly per device/package family.

C. E.S.D. and Latch-Up Testing

The DW04 die type has been found to have all pins able to withstand a transient pulse of ±1000V, per Mil-

Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device

withstands a current of ±250mA.

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