MC100E142 查看數據表（PDF） - ON Semiconductor
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MC100E142 Datasheet PDF : 8 Pages
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MC10E142, MC100E142
Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 9)
−40°C
25°C
Symbol
fSHIFT
tPLH
tPHL
Characteristic
Maximum Toggle Frequency
Propagation Delay to Output
Min Typ Max Min Typ Max Min
700 900
700 900
700
CLK 600
MR 600
800 1000 600
800 1000 600
800 1000 600
800 1000 600
tS
Setup Time
D 50 −100
50 −100
50
SEL 300 150
300 150
300
tH
Hold Time
D 300 100
300 100
300
SEL 75 150
75 150
75
tSKEW Within-Device Skew (Note 10)
D to Q
75
75
tRR
tSKEW
tJITTER
tr, tf
Reset Recovery Time
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Times
(20 - 80%)
900 700
900 700
900
75
75
<1
<1
300 525 800 300 525 800 300
85°C
Typ
900
800
800
−100
150
100
150
75
700
75
<1
525
Max
1000
1000
Unit
MHz
ps
ps
ps
ps
ps
ps
ps
ps
800
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
9. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
10. Within-device skew is defined as identical transitions on similar paths through a device.
Q
Driver
Device
Q
Zo = 50 W
Zo = 50 W
50 W
50 W
D
Receiver
Device
D
VTT
VTT = VCC − 2.0 V
Figure 3. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
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