MC100LVEP111MNRG 查看數據表（PDF） - ON Semiconductor

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MC100LVEP111MNRG

2.5V / 3.3V1:10 Differential ECL/PECL/HSTL Clock Driver

ON Semiconductor 

MC100LVEP111

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Units

VCC

PECL Mode Power Supply

VEE

NECL Mode Power Supply

VI

PECL Mode Input Voltage

NECL Mode Input Voltage

Iout

Output Current

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

Continuous

Surge

VI ≤ VCC

VI ≥ VEE

6

V

−6

V

6

V

−6

V

50

mA

100

mA

IBB

VBB Sink/Source

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

LQFP−32

LQFP−32

± 0.5

−40 to +85

−65 to +150

80

55

mA

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) Standard Board

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

500 lfpm

LQFP−32

QFN−32

QFN−32

12 to 17

31

27

°C/W

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) 2S2P

QFN−32

Tsol

Wave Solder

Pb < 3 sec @ 248°C

Pb−Free (QFN−32 Only) < 3 sec @ 260°C

12

°C/W

265

°C

265

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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