33981 查看數據表（PDF） - Freescale Semiconductor

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33981

Single High Side Switch (4.0 mOhm), PWM clock up to 60 kHz

Freescale Semiconductor 

ELECTRICAL CHARACTERISTICS

STATIC ELECTRICAL CHARACTERISTICS

Table 4. Static Electrical Characteristics (continued)

Characteristics noted under conditions 6.0 V  VPWR  27 V, -40 C  TA  125 C, unless otherwise noted. Typical values

noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.

Characteristic

Symbol

Min

Typ

Max

Unit

POWER OUTPUT (VPWR) (continued)

Current Sense Voltage Clamp

I CSNS = 15 mA

Current Sense Leakage(10)

I NHS = 1 with OUT opened of load or INHS = 0

VCL(CSNS)

V

4.5

6.0

7.0

ILEAK(CSNS)

0

A

13

17

Over-temperature Shutdown

Over-temperature Shutdown Hysteresis(11)

LOW SIDE GATE DRIVER (VPWR, VGLS, VOCLS)

TSD

160

175

190

°C

TSDHYS

5.0

–

20

C

Low Side Gate Voltage

VPWR = 6.0 V

VPWR = 9.0 V

VPWR = 13 V

VPWR = 27 V

VGLS

V

5.0

5.4

6.0

8.0

8.4

9.0

12.0

12.4

13.0

12.0

12.4

13.0

Low Side Gate Sinked Current

VGLS = 2.0 V, VPWR = 13 V

I GLSNEG

mA

–

100

–

Low Side Gate Sourced Current

VGLS = 2.0 V, VPWR = 13 V

I GLSPOS

mA

–

100

–

Low Side Overload Detection Level versus Low Side Drain Voltage

VDS_LS

mV

VOCLS - VDLS, (VOCLS V

-50

–

+50

CONTROL INTERFACE (CONF, INHS, INLS, EN, OCLS)

Input Logic High-voltage (CONF, INHS, INLS)

VIH

3.3

–

–

V

Input Logic Low-voltage (CONF, INHS, INLS)

VIL

–

–

1.0

V

Input Logic Voltage Hysteresis (CONF, INHS, INLS)

VINHYS

100

600

1200

mV

Input Logic Active Pull-down Current (INHS, INLS)

IDWN

5.0

10

20

A

Enable Pull-down Resistor (EN)

RDWN

100

200

400

k

Enable Voltage Threshold (EN)

VEN

2.5

V

Input Clamp Voltage (EN)

IEN < 2.5 mA

VCLEN

V

7.0

–

14

Input Forward Voltage (EN)

VF(EN)

-2.0

–

-0.3

V

Input Active Pull-up Current (OCLS)

IOCLS p

50

100

200

A

Input Active Pull-up Current (CONF)

I CONF

5.0

10

20

A

Notes

10. This parameter is achieved by the design characterization by measuring a statistically relevant sample size across process variations

but not tested in production.

11. Parameter is guaranteed by process monitoring but is not production tested.

33981

8

Analog Integrated Circuit Device Data

Freescale Semiconductor

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