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MC34701 查看數據表(PDF) - Freescale Semiconductor

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MC34701 Datasheet PDF : 39 Pages
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. DYNAMIC ELECTRICAL CHARACTERISTICS (continued)
Characteristics noted under conditions -40°C TA 85°C unless otherwise noted. Input voltages VIN1 = VIN2 = 3.3V using
the typical application circuit (see Figures 33), unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
BOOST REGULATOR
Boost Regulator MOSFET Maximum ON Time(21)
Boost Regulator Control Loop Propagation Delay(21)
Boost Switching Node VBD Rise Time(21)
IBST = 20mA
Boost Switching Node VBD Fall Time(21)
IBST = 20mA
LINEAR REGULATOR (LDO)
tON
24
µs
tBST_PD
50
ns
tB_RISE
ns
5.0
tB_FALL
ns
3.0
Fault Condition Timeout
Retry Timer Cycle
RESET MONITOR (RST)
tFAULT
7.0
10
15
ms
tRET
70
100
150
ms
Monitoring LFB Pin Delay
Monitoring INV Pin Delay
SCA, SCL PIN, I2C BUS (STANDARD)
tD_RST_LFB
12
28
µs
tD_RST_INV
12
28
µs
SCL Clock Frequency(21)
fSCL
100
kHz
Bus Free Time Between a STOP and a START Condition(21)
tBUF
4.7
µs
Hold Time (Repeated) START Condition (After this period, the first clock
tHD-STA
pulse is generated.)(21)
4.0
µs
Low Period of the SCL Clock(21)
tLOW
4.7
µs
High Period of the SCL Clock(21)
tHIGH
4.0
µs
SDA Fall Time from VIH_MAX to VIL_MIN, Bus Capacitance 10pF to 400pF,
tF
3.0mA Sink Current(21), (23)
ns
250
Setup Time for a Repeated START Condition(21)
tSU-STA
4.7
µs
Data Hold Time for I2C Bus Devices(21), (22)
tHD-DAT
0.0
µs
Data Setup Time(21)
tSU-DAT
250
ns
Setup Time for STOP Condition(21)
tSU-STO
4.0
µs
Capacitive Load for Each Bus Line(21)
CB
400
pF
Notes
21. Design information only. This parameter is not production tested.
22. The device provides an internal hold time of at least 300ns for the SDA signal (refer to the VIH_MIN of the SCL signal) to bridge the
undefined region of the falling edge of SCL.
23. VIH is high level voltage on I2C bus lines and VIL is low level voltage on I2C bus lines
Analog Integrated Circuit Device Data
Freescale Semiconductor
34701
13

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