MCF51EM128 查看數據表（PDF） - Freescale Semiconductor

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MCF51EM128

ColdFire Microcontroller

Freescale Semiconductor 

Electrical Characteristics

TJ = TA + (PD × θJA)

Eqn. 1

where:

TA = Ambient temperature, °C

θJA = Package thermal resistance, junction-to-ambient, °C/W

PD = Pint + PI/O

Pint = IDD × VDD, Watts — chip internal power

PI/O = Power dissipation on input and output pins — user determined

For most applications, PI/O << Pint and can be neglected. An approximate relationship between PD and TJ

(if PI/O is neglected) is:

PD = K ÷ (TJ + 273°C)

Eqn. 2

Solving Equation 1 and Equation 2 for K gives:

K = PD × (TA + 273°C) + θJA × (PD)2

Eqn. 3

where K is a constant pertaining to the particular part. K can be determined from Equation 3 by measuring

PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by

solving Equation 1 and Equation 2 iteratively for any value of TA.

2.4 Electrostatic Discharge (ESD) Protection Characteristics

Although damage from static discharge is much less common on these devices than on early CMOS

circuits, normal handling precautions should be used to avoid exposure to static discharge. Qualification

tests are performed to ensure that these devices can withstand exposure to reasonable levels of static

without suffering any permanent damage.

All ESD testing is in conformity with CDF-AEC-Q00 Stress Test Qualification for Automotive Grade

Integrated Circuits. (http://www.aecouncil.com/) This device was qualified to AEC-Q100 Rev E.

A device is considered to have failed if, after exposure to ESD pulses, the device no longer meets the

device specification requirements. Complete dc parametric and functional testing is performed per the

applicable device specification at room temperature followed by hot temperature, unless specified

otherwise in the device specification.

Table 8. ESD and Latch-up Test Conditions

Model

Human Body

Machine

Latch-up

Description

Series Resistance

Storage Capacitance

Number of Pulse per pin

Series Resistance

Storage Capacitance

Number of Pulse per pin

Minimum input voltage limit

Maximum input voltage limit

Symbol

Value

Unit

R1

1500

Ω

C

100

pF

—

3

R1

0

Ω

C

200

pF

—

3

–2.5

V

7.5

V

MCF51EM256 Series ColdFire Microcontroller Data Sheet, Rev.2

Freescale Semiconductor

Preliminary—Subject to Change Without Notice

19

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