MCP4019T-502E/LT 查看數據表（PDF） - Microchip Technology

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MCP4019T-502E/LT

7-Bit Single I²C™ Digital POT with Volatile Memory in SC70

Microchip Technology 

1.0 ELECTRICAL

CHARACTERISTICS

Absolute Maximum Ratings †

Voltage on VDD with respect to VSS ..... -0.6V to +7.0V

Voltage on SCL, and SDA with respect to VSS

............................................................................. -0.6V to 12.5V

Voltage on all other pins (A, W, and B)

with respect to VSS ............................ -0.3V to VDD + 0.3V

Input clamp current, IIK

(VI < 0, VI > VDD, VI > VPP ON HV pins) ........... ±20 mA

Output clamp current, IOK

(VO < 0 or VO > VDD) ....................................... ±20 mA

Maximum output current sunk by any Output pin

........................................................................... 25 mA

Maximum output current sourced by any Output pin

........................................................................... 25 mA

Maximum current out of VSS pin ...................... 100 mA

Maximum current into VDD pin ......................... 100 mA

Maximum current into A, W and B pins........... ±2.5 mA

Package power dissipation (TA = +50°C, TJ = +150°C)

SC70-5 ............................................................ 302 mW

SC70-6 .................................................................. TBD

Storage temperature .......................... -65°C to +150°C

Ambient temperature with power applied

........................................................... -40°C to +125°C

ESD protection on all pins ........................≥ 4 kV (HBM)

........................................................................≥ 400V (MM)

Maximum Junction Temperature (TJ) .............. +150°C

MCP4017/18/19

† Notice: Stresses above those listed under “Maximum

Ratings” may cause permanent damage to the device.

This is a stress rating only and functional operation of

the device at those or any other conditions above those

indicated in the operational listings of this specification

is not implied. Exposure to maximum rating conditions

for extended periods may affect device reliability.

© 2009 Microchip Technology Inc.

DS22147A-page 3

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