PPC5553AVR132R2 查看數據表（PDF） - Freescale Semiconductor

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PPC5553AVR132R2

Microcontroller

Freescale Semiconductor 

Electrical Characteristics

3.4 EMI (Electromagnetic Interference) Characteristics

Table 4. EMI Testing Specifications1

Num

Characteristic

Min. Value Typ. Value Max. Value

Unit

1 Scan Range

0.15

—

1000

MHz

2 Operating Frequency

—

—

132

MHz

3 VDD Operating Voltages

—

1.5

—

V

4 VDDSYN, VRC33, VDD33, VFLASH, VDDE Operating Voltages

—

3.3

—

V

5 VPP, VDDEH, VDDA Operating Voltages

—

5.0

—

V

6 Maximum Amplitude

—

—

142

dBuV

323

7 Operating Temperature

—

—

25

oC

1 EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing is performed on the MPC5554 and

applied to MPC5500 family as generic EMI performance data.

2 As measured with “single-chip” EMI program.

3 As measured with “expanded” EMI program.

3.5 ESD Characteristics

Table 5. ESD Ratings1, 2

Characteristic

Symbol

Value

Unit

ESD for Human Body Model (HBM)

2000

V

HBM Circuit Description

R1

1500

Ohm

C

100

pF

ESD for Field Induced Charge Model (FDCM)

500 (all pins)

750 (corner pins)

V

Number of Pulses per pin:

Positive Pulses (HBM)

Negative Pulses (HBM)

—

1

—

—

1

—

Interval of Pulses

—

1

second

1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.

2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification

requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at room

temperature followed by hot temperature, unless specified otherwise in the device specification

MPC5553 Microcontroller Data Sheet, Rev. 0

Freescale Semiconductor

Preliminary—Subject to Change Without Notice

9

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