SPT7870SCU 查看數據表（PDF） - Signal Processing Technologies
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SPT7870SCU Datasheet PDF : 8 Pages
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ELECTRICAL SPECIFICATIONS
TA=+25 °C, VCC=+5.0 V, VEE=-5.2 V, VIN=±1.0 V, fClock=80 MHz, 50% clock duty cycle, unless otherwise specified.
TEST
PARAMETERS
CONDITIONS
Dynamic Performance
Signal-to-Noise & Distortion (SINAD)
fIN = 10 MHz
fIN = 25 MHz
fIN = 25 MHz
fClock = 100 MHz
fIN = 50 MHz
fIN = 50 MHz
fClock = 100 MHz
Spurious Free Dynamic Range
fIN = 10 MHz
fIN = 25 MHz
fIN = 50 MHz
Two-Tone Intermodulation
Dist. Rejection2
Differential Phase
Differential Gain
Power Supply Requirements
+VCC Supply Voltage
- VEE Supply Voltage
+VCC Supply Current
- VEE Supply Current
Power Dissipation
Power Supply Rejection Ratio
Digital Inputs
LINV, MINV
Clock Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current HIgh
Pulse Width Low (tpwl)
Pulse Width High (tpwh)
Rise/Fall Time
20% to 80%
Digital Outputs
Logic 1 Voltage (ECL)
50 Ω to -2 V, DGND=0.0 V
Logic 0 Voltage (ECL)
50 Ω to -2 V, DGND=0.0 V
Logic 1 Voltage (PECL)
50 Ω to +3 V, DGND=+5.0 V
Logic 0 Voltage (PECL)
50 Ω to +3 V, DGND=+5.0 V
trise
10% to 90%
tfall
10% to 90%
TEST
LEVEL
I
I
V
I
V
V
V
V
V
V
V
IV
IV
VI
VI
VI
IV
V
VI
VI
VI
VI
IV
IV
IV
VI
VI
IV
IV
V
V
MIN
TYP
51
54
51
53
50
46.5
48
47
65
62
52
-65
0.5
1
4.75
5.0
-4.95
-5.2
127
202
1.7
30
CMOS/TTL
-1.1
-100
-100
4.0
4.0
-1.1
-0.9
-1.7
3.9
4.1
3.3
2.0
2.0
MAX
5.25
-5.45
151
240
2.0
-1.5
+100
+100
250
250
1.5
-1.5
3.5
12048 pt FFT using distortion harmonics 2 through 10.
2Measured as a second order (f1-f2) intermodulation product from a two-tone test, with each input tone at 0 dBm.
UNITS
dB
dB
dB
dB
dB
dB FS
dB FS
dB FS
dBc
Degree
%
V
V
mA
mA
W
dB
Logic
V
V
µA
µA
ns
ns
ns
V
V
V
V
ns
ns
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
V
column indicates that the specification is not
tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
SPT
3
SPT7870
9/8/98
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