NCV4275A 查看數據表（PDF） - ON Semiconductor

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NCV4275A

5.0 V, 3.3 V 450 mA Low-Dropout Voltage Regulator with Reset

ON Semiconductor 

NCV4275A

PIN FUNCTION DESCRIPTION

Pin #

ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ 1

ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ 2

ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ 3, Tab

ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ 4

ÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑÑ 5

Symbol

Description

I

Input; Battery Supply Input Voltage. Bypass to ground with a ceramic capacitor.

RO Reset Output; Open Collector Active Reset (accurate when I > 1.0 V).

GND Ground; Pin 3 internally connected to tab.

D

Reset Delay; timing capacitor to GND for Reset Delay function.

Q

Output; ±2.0%, 450 mA output. Bypass with 22 mF capacitor, ESR < 4.5 Ω (5.0 V Version), 3.5 Ω (3.3 V Version) to ground.

MAXIMUM RATINGS

Rating

Symbol

Min

Max

Unit

Input Voltage

VI

−42

45

V

Input Peak Transient Voltage

VI

−

45

V

Output Voltage

VQ

−1.0

16

V

Reset Output Voltage

VRO

−0.3

25

V

Reset Output Current

IRO

−5.0

5.0

mA

Reset Delay Voltage

VD

−0.3

7.0

V

Reset Delay Current

ID

−2.0

2.0

mA

ESD Susceptibility (Note 1) − Human Body Model

− Machine Model

− Charge Device Model

ESDHBM

ESDMM

ESDCDM

4.0

200

1000

−

kV

−

V

−

V

Junction Temperature

TJ

−40

150

°C

Storage Temperature

Tstg

−55

150

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. This device incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AEC−Q100−002, ESD

Machine Model tested per AEC−Q100−003, ESD Charged Device Model tested per AEC−Q100−011, Latch−up tested per AEC−Q100−004.

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2

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