NM27C020 查看數據表（PDF） - Fairchild Semiconductor

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NM27C020

2,097,152-Bit (256K x 8) UV Erasable CMOS EPROM

Fairchild Semiconductor 

Absolute Maximum Ratings (Note 1)

Storage Temperature

-65°C to +125°C

All Input Voltage Except A9 with

Respect to Ground (Note 13)

-0.6V to +7V

VPPand A9 with Respect to Ground

VCC Supply Voltage with

Respect to Ground

-0.6V to +14V

-0.6V to +7V

ESD Protection

>2000V

All Output Voltages with

Respect to Ground (Note 13)

Operating Range

VCC + 10V to GND -0.6V

Range

Commercial

Industrial

Temperature

0°C to +70°C

-40°C to +85°C

VCC Tolerance

+5V

±10

+5V

±10%

DC Read Characteristics Over Operating Range with VPP = VCC

Symbol

Parameter

Test Conditions

VIL

VIH

VOL

VOH

ISB1(Note 4)

ISB2

ICC (Note 2)

IPP

VPP

ILI

ILO

Input Low Level

Input High Level

Output Low Voltage

Output High Voltage

VCC Standby Current (CMOS)

VCC Standby Current (TTL)

VCC Active Current

VPP Supply Current

VPP Read Voltage

Input Load Current

Output Leakage Current

IOL = 2.1 mA

IOH = -400 µA

CE = VCC ± 0.3V

CE = VIH

CE, OE = VIL

I/O = 0 mA, f = 5 MHz

Inputs = VIH or VIL

VPP = VCC

VIN = 5.5 or GND

VOUT = 5.5V or GND

Commercial

Industrial

Min

-0.5

2.0

3.5

VCC - 0.4

-1

-10

Max

0.8

VCC +1

-0.4

100

1

30

30

Units

V

V

V

V

µA

mA

mA

10

µA

VCC

V

1

µA

10

µA

AC Read Characteristics Over Operating Range with VPP = VCC

Symbol

Parameter

100

120

Min Max Min Max

tACC

tCE

tOE

tDF (Note 3)

tOH

Address to Output Delay

CE to Output Delay

OE to Output Delay

Output Disable to Output Float

Output Hold from Addresses, CE

or OE , Whichever Occurred First

100

120

100

120

40

45

40

45

0

0

150

Min Max

150

150

50

50

0

Units

ns

ns

ns

ns

ns

Note 1: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of

the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions

for extended periods of time may affect device reliability.

Note 2: The supply current is the sum of ICC and IPP. The maximum current value is with Outputs O0 to O7 unloaded.

Note 3: This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven-see timing diagram.

Note 4: CMOS inputs: VIL = GND 10.3V, VIH = VCC 10.3V.

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