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PLUS17310N

Programmable logic array (22 × 42 × 10)

Philips Electronics 

Philips Semiconductors Programmable Logic Devices

Programmable logic array

(22 × 42 × 10)

Product specification

PLUS173–10

DC ELECTRICAL CHARACTERISTICS

0°C ≤ Tamb ≤ +75°C, 4.75 ≤ VCC ≤ 5.25V

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

MIN TYP1 MAX

UNIT

Input voltage2

VIL

Low

VIH

High

VIC

Clamp

Output voltage2

VCC = MIN

VCC = MAX

VCC = MIN, IIN = –12mA

0.8

V

2.0

V

–0.8

–1.2

V

VOL

Low4

VOH

High5

Input current9

VCC = MIN

IOL = 15mA

IOH = –2mA

0.4

0.5

V

2.4

2.9

V

IIL

Low

IIH

High

Output current

VCC = MAX

VIN = 0.45V

VIN = VCC

–20 –100

µA

1

40

µA

IO(OFF)

Hi-Z state8

IOS

Short circuit3, 5, 6

ICC

VCC supply current7

Capacitance

VCC = MAX

VOUT = 2.7V

VOUT = 0.45V

VOUT = 0V

VCC = MAX

0

80

µA

–15 –140

–15

–30

–70

mA

170

210

mA

VCC = 5V

IIN

Input

VIN = 2.0V

8

pF

CB

I/O

VB = 2.0V

15

pF

NOTES:

1. All typical values are at VCC = 5V, Tamb = +25°C.

2. All voltage values are with respect to network ground terminal.

3. Test one at a time.

4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I10 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the

same conditions except I11 = 0V.

5. Same conditions as Note 4 except input I11 = +10V.

6. Duration of short circuit should not exceed 1 second.

7. ICC is measured with inputs I0 – I11 and B0 – B9 = 0V. Part in Virgin State.

8. Leakage values are a combination of input and output leakage.

9. IIL and IIH limits are for dedicated inputs only (I0 – I11).

October 22, 1993

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