RE46C129 查看數據表（PDF） - Microchip Technology

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RE46C129

CMOS Ionization Smoke Detector ASIC with Interconnect

Microchip Technology 

R&E International

A Subsidiary of Microchip Technology Inc.

RE46C129

CMOS Ionization Smoke Detector ASIC with Interconnect

Product Specification

General Description

The RE46C129 is low power CMOS ionization type

smoke detector IC. With few external components this

circuit will provide all the required features for an

ionization type smoke detector.

An internal oscillator strobes power to the smoke

detection circuitry for 10.5mS every 1.66 seconds to

keep standby current to a minimum. A check for a low

battery condition is performed every 40 seconds when

in standby.

An interconnect pin allows multiple detectors to be

connected such that when one units alarms all units will

sound.

Although this device was designed for smoke detection

utilizing an ionization chamber it could be used in a

variety of security applications.

The RE46C129 is recognized by Underwriters

Laboratories for use in smoke detectors that comply

with specification UL217 and UL268.

Features

• Guard Outputs for Ion Detector Input

• +/-0.75pA Detect Input Current

• Internal Reverse Battery Protection

• Low Quiescent Current Consumption (<6.5uA)

• Available in 16L PDIP or 16L N SOIC

• ESD Protection on all Pins

• Internal Low Battery Detection

• Interconnect up to 40 Detectors

• Compatible with Allegro A5350

• UL Recognized per File S24036

• Available in Standard Packaging or RoHS

Compliant Pb Free Packaging.

Pin Configuration

NC

1

IO

2

LBADJ

3

NC

4

LED

5

VDD 6

RBIAS

7

FEED 8

16 GUARD2

15 DETECT

14 GUARD1

13 VSEN

12 OSCAP

11 HS

10 HB

9 VSS

ABSOLUTE MAXIMUM RATINGS

PARAMETER

Supply Voltage

Input Voltage Range Except FEED, IO

FEED Input Voltage Range

IO Input Voltage Range

Reverse Battery Time

Input Current except FEED

Operating Temperature

Storage Temperature

Maximum Junction Temperature

SYMBOL

VDD

Vin

Vinfd

Vio1

TRB

Iin

TA

TSTG

TJ

VALUE

15

-.3 to Vdd +.3

-10 to +22

-.3 to 17

5

10

-10 to 60

-55 to 125

150

UNITS

V

V

V

V

S

mA

°C

°C

°C

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are

stress ratings only and operation at these conditions for extended periods may affect device reliability.

This product utilizes CMOS technology with static protection; however proper ESD prevention procedures should be used

when handling this product. Damage can occur when exposed to extremely high static electrical charge.

© 2009 Microchip Technology Inc.

DS22172B-page 1

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