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HN58C65P-25 查看數據表(PDF) - Hitachi -> Renesas Electronics

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HN58C65P-25 Datasheet PDF : 16 Pages
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HN58C65 Series
Write Cycle
Parameter
Symbol Min*1 Typ Max Unit Test Conditions
Address setup time
t AS
0
ns
Address hold time
t AH
150 —
ns
CE to write setup time (WE controlled) tCS
0
ns
CE hold time (WE controlled)
t CH
0
ns
WE to write setup time (CE controlled) tWS
0
ns
WE hold time (CE controlled)
t WH
0
ns
OE to write setup time
t OES
0
ns
OE hold time
t OEH
0
ns
Data setup time
t DS
100 —
ns
Data hold time
t DH
20
ns
WE pulse width (WE controlled)
t WP
200 —
ns
CE pulse width (CE controlled)
t CW
200 —
ns
Data latch time
t DL
100 —
ns
Byte lode cycle
t BLC
0.30 —
30
µs
Byte lode window
t BL
100 —
µs
Write cycle time
t WC
10*2
ms
Time to devce busy
t DB
120 —
ns
Write start time
t DW
150 —
ns
Notes: 1. Use this device in longer cycle than this value.
2. tWC must be longer than this value unless polling technique is used. This device automatically
completes the internal write operation within this value.
7

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