SAA5233 查看數據表（PDF） - Philips Electronics

零件编号

产品描述 (功能)

生产厂家

SAA5233

Dual standard PDC decoder

Philips Electronics 

Philips Semiconductors

Dual standard PDC decoder

Objective specification

SAA5233

QUALITY AND RELIABILITY

This device will meet the requirements of the “Philips Semiconductors General Quality Specification SNW-FQ-611E” in

accordance with “Quality Reference Pocketbook (order number 9398 510 34011)”. The principal requirements are as

shown in Tables 1 to 4.

Group A

Table 1 Acceptance tests per lot.

Mechanical

Electrical

TEST

REQUIREMENTS(1)

cumulative target: <100 ppm

cumulative target: <100 ppm

Group B

Table 2 Processability tests (by package family).

TEST

Solderability

Mechanical

Solder heat resistance

<7% LTPD

<15% LTPD

<15% LTPD

REQUIREMENTS(1)

Group C

Table 3 Reliability tests (by process family).

TEST

Operational life

CONDITIONS

168 hours at Tj = 150 °C

Humidity life

Temperature cycling performance

temperature, humidity, bias

(1000 hours, 85 °C, 85% RH or

equivalent test)

Tstg(min) to Tstg(max)

REQUIREMENTS(1)

<1500 FPM; equivalent to <100 FITS

at Tj = 70 °C

<2000 FPM

<2000 FPM

Table 4 Reliability tests (by device type).

TEST

ESD and latch-up

CONDITIONS

ESD Human body model

2000 V; 100 pF; 1.5 kΩ

ESD Machine model

200 V; 200 pF; 0 Ω

latch-up 100 mA; 1.5 × VDD

(absolute maximum)

Note to Tables 1 to 4.

1. ppm = fraction of defective devices, in parts per million.

LTPD = Lot Tolerance Percent Defective.

FPM = fraction of devices failing at test condition, in Failures Per Million.

FITS = Failures In Time Standard.

REQUIREMENTS(1)

<15% LTPD

<15% LTPD

<15% LTPD

June 1994

6

Share Link: