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SI3230MPPQX-EVB 查看數據表(PDF) - Silicon Laboratories

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SI3230MPPQX-EVB Datasheet PDF : 108 Pages
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Si3230
Table 4. Linefeed Characteristics (Continued)
(VDDA, VDDD = 3.13 to 5.25 V, TA = 0 to 70°C for K-Grade, –40 to 85°C for B-Grade)
Parameter
Symbol
Test Condition
Min Typ Max Unit
Trapezoidal Ring Crest
Factor Accuracy
Crest factor = 1.3
–.05
.05
Sinusoidal Ring Crest
RCF
Factor
1.35
1.45
Ringing Frequency Accuracy
Ringing Cadence Accuracy
Calibration Time
Power Alarm Threshold
Accuracy
f = 20 Hz
–1
1
%
Accuracy of ON/OFF Times –50
50
ms
CAL to CAL Bit
600
ms
At Power Threshold = 300 mW –25
25
%
*Note: DC resistance round trip; 160 corresponds to 2 kft 26 gauge AWG.
Table 5. Monitor ADC Characteristics
(VDDA, VDDD = 3.13 to 5.25 V, TA = 0 to 70°C for K-Grade, –40 to 85°C for B-Grade)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Differential Nonlinearity
(6-bit resolution)
Integral Nonlinearity
(6-bit resolution)
Gain Error (voltage)
DNLE
INLE
–1/2
–1
1/2
LSB
1
LSB
10
%
Gain Error (current)
20
%
Table 6. Si3230 DC Characteristics, VDDA = VDDD = 5.0 V
(VDDA,VDDD = 4.75 V to 5.25 V, TA = 0 to 70°C for K-Grade, –40 to 85°C for B-Grade)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
High Level Input Voltage
VIH
0.7 x VDDD
V
Low Level Input Voltage
VIL
0.3 x VDD
V
D
High Level Output Voltage VOH DIO1,DIO2,SDITHRU:IO = –4 mA VDDD – 0.6 —
V
SDO:IO = –8 mA
DOUT: IO = –40 mA
VDDD – 0.8 —
V
Low Level Output Voltage VOL
DIO1,DIO2,DOUT,SDITHRU:
IO = 4 mA
SDO,INT:IO = 8 mA
0.4
V
Input Leakage Current
IL
–10
10
µA
8
Preliminary Rev. 0.96

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