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SI5324A-C-GM 查看數據表(PDF) - Silicon Laboratories

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SI5324A-C-GM Datasheet PDF : 72 Pages
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Si5324
Table 3. AC Characteristics (Continued)
(VDD = 1.8 ± 5%, 2.5 ±10%, or 3.3 V ±10%, TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Output Rise/Fall
(20–80 %) @
CKOTRF Output not configured for
230
350
ps
CMOS or Disabled
622.08 MHz output
See Figure 2
Output Rise/Fall
(20–80%) @
212.5 MHz output
Output Rise/Fall
(20–80%) @
212.5 MHz output
Output Duty Cycle
Uncertainty @
622.08 MHz
CKOTRF
CMOS Output
VDD = 1.71
CLOAD = 5 pF
CKOTRF
CMOS Output
VDD = 2.97
CLOAD = 5 pF
CKODC
100 Load
Line-to-Line
Measured at 50% Point
(Not for CMOS)
8
ns
2
ns
+/-40
ps
LVCMOS Input Pins
Minimum Reset Pulse
Width
Reset to Microproces-
sor Access Ready
LVCMOS Output Pins
tRSTMN
tREADY
1
µs
10
ms
Rise/Fall Times
tRF
CLOAD = 20pf
25
ns
See Figure 2
LOSn Trigger Window LOSTRIG From last CKINn to
Internal detection of LOSn
N3 1
4.5 x N3 TCKIN
Time to Clear LOL after
LOS Cleared
tCLRLOL
LOS to LOL
Fold = Fnew
10
ms
Stable Xa/XB reference
Notes:
1. Input to output phase skew after an ICAL is not controlled and can assume any value.
2. Lock and settle time performance is dependent on the frequency plan, the XAXB reference frequency, and LOCKT
setting (see application note, “AN803: Lock and Settling Time Considerations for Si5324/27/69/74 Any-Frequency
Jitter Attenuating Clock ICs”. Visit the Silicon Labs Technical Support web page at:
https://www.silabs.com/support/pages/contacttechnicalsupport.aspx to submit a technical support request regarding
the lock time of your frequency plan.
3. LOCKT = 3.3 ms
10
Rev. 1.1

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