NE56632-XX 查看數據表（PDF） - Philips Electronics
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NE56632-XX Datasheet PDF : 16 Pages
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Philips Semiconductors
Active-LOW system reset with adjustable delay time
Product data
NE56632-XX
TYPICAL PERFORMANCE CURVES, NE56632-31
3.11
3.10
3.09
3.08
–40
–20
0
20
Test Circuit 1
VCC = HIGH-to-LOW
RL = 4.7 kΩ
VOL ≤ 0.4 V
S1 = ON
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01629
Figure 12. Detection threshold versus temperature.
0.23
0.22
0.21
0.20
0.19
0.18
0.17
–40
–20
0
20
Test Circuit 1
VCC1 = VS(min) – 0.05 V
RL = 4.7 kΩ
S1 = ON
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01631
Figure 14. LOW–level output voltage versus temperature.
4.5
4.0
3.5
3.0
2.5
Test Circuit 1
RL = ∞
VCC1 = VS(typ)/0.85
2.0
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01633
Figure 16. Supply current (OFF time) versus temperature.
90
80
70
60
50
Test Circuit 1
40 VCC = LOW-to-HIGH
RL = 4.7 kΩ
S1 = ON
30
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01630
Figure 13. Hysteresis voltage versus temperature.
9
8
7
6
5
4
3 Test Circuit 1
VCC1 = VS(min) – 0.05 V
RL = ∞
2
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01632
Figure 15. Supply current (ON time) versus temperature.
0.9
0.8
0.7
0.6
0.5
Test Circuit 1
0.4 RL = 4.7 kΩ
VOL ≤ 0.4 V
S1 = ON
0.3
–40
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, Tamb (°C)
SL01634
Figure 17. Min. operating threshold voltage versus
temperature.
2002 Mar 25
7
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