TCA1A106M8R 查看數據表（PDF） - ROHM Semiconductor

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TCA1A106M8R

Chip tantalum capacitors with open-function built-in

ROHM Semiconductor 

Tantalum capacitors

TCFG series

Item

Performance

Test methods / conditions

(based on JIS C 5102,5143)

Temperature

characteristics

Temperature −55°C

∆C / C

P case within +0% and −15% of the value before testing.

A B case within +10% and −0% of the value before testing.

tanδ

P case within 1.5 times of the value before testing.

A B case must satisfy the initial specified value.

L.C

−

Temperature +85°C

∆C / C

P case within +0% and −15% of the value before testing.

A B case within +0% and −10% of the value before testing.

tanδ

Must satisfy the initial specified value.

L.C

Less than or equal to the larger of 5µA or 0.1CV.

Temperature +125°C

∆C / C

P case within +20% and −0% of the value before testing.

A B case within +15% and −0% of the value before testing.

tanδ

P case within 1.5 times of the value before testing.

A B case must satisfy the initial specified value.

L.C

Less than or equal to the larger of 6.3µA or

0.125CV.

Surge

resistance

Appearance

L.C

∆C / C

A B case no noticeable irregularities, and the

markings must be easy to read.

Must satisfy the initial specified value.

P case within ± 10%

A B case within ± 5%

Apply the rated surge voltage for

30 ± 5s at intervals of 5 ± .05mins.

1000 times, with the temperature at

85 ± 2°C.

High-

temperature

load

Terminal

strength

tanδ

Appearance

L. C

∆C / C

tanδ

Capacitance

Appearance

P case within 1.5 times of the value before testing.

A B case must satisfy the initial specified value.

No noticeable irregularities, and the

markings must be easy to read.

Must satisfy the initial specified value.

Within ± 10%

P case within 1.5 times of the value before testing.

A B case must satisfy the initial specified value.

Value must be stable during measurement.

No noticeable irregularities.

Temp.

: 85 ± 2°C

Series Resistance : 3Ωmax.

Applied voltage : rated voltage

Test time

:

P

case

1000

+36

−0

hrs

A

B

case

2000

+73

−0

hrs

meusure made after pieces shall be left for

1 to 2 hrs under room temp. and room

humidity after test.

Apply pressure to the device using the

specified tool for 5s so that the center

deflection is 1mm (see below).

20

50

(Units: mm)

F (Direction of force)

R230

1

45 45

4/15

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