TGA4953-SL 查看數據表（PDF） - TriQuint Semiconductor

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TGA4953-SL

9.9-12.5Gb/s Optical Modulator Driver

TriQuint Semiconductor 

Parameter

TABLE III

RF CHARACTERIZATION TABLE

(TA = 25°C, Nominal)

Product Datasheet

Jan 4, 2012

TGA4953-SL

Test Conditions

Min

Typ Max Units Notes

Eye Amplitude

Additive Jitter

(RMS)

VD2T = 8.0V

VD2T = 6.5V

VD2T = 5.5V

VD2T = 4.5V

VD2T = 4.0V

VIN = 500mVPP

VIN = 800mVPP

10

8.0

7.0

VPP 3/ 4/

6.0

5.5

0.9

1.0

2.0

2.0

Ps

5/

Q-Factor

VIN = 500mVPP

VIN = 800mVPP

28.5

35

28.5

35

V/V

Delta Eye

Amplitude

| 500–800 mV in p-p| -0.10

0.10 VPP

Delta Crossing

Percentage

| 500–800 mV in p-p|

-6

6

%

Table III Notes:

1/ Verified at package level RF test

2/ Typical Package RF Test Bias Conditions: Vdd = 5V, adjust VG1 to achieve Idd = 65mA then

adjust VG2 to achieve ID2T = 115 – 155 mA (Idd = 180 - 220mA), VCTRL1 = -0.2V & VCTRL2 =

+0.2 V

3/ Verified by design, SMT assembled onto a demonstration board detailed on sheet 6.

4/ VIN = 250mV, Data Rate = 10.7Gb/s, VD1 = VD2T or greater, VCTRL2 and VG2 are adjusted for

maximum output. Typical final Idd under drive ~ 220 mA.

5/ Computed using RSS Method where JRMS_DUT = √(JRMS_TOTAL2 - JRMS_SOURCE2)

6/ Verified at die level on-wafer probe

7/ Power Bias Die Probe: VTEE = 8V, adjust VG to achieve Idd = 175mA ±5%, VCTRL = +1.5V

Note: At the die level, drain bias is applied through the RF output port using a bias tee, voltage

is at the DC input to the bias tee

TriQuint Semiconductor: www. triquint.com (972)994-8465 Fax (972)994-8504 info-networks@tqs.com 5

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