TK15326 查看數據表（PDF） - Toko America Inc
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TK15326 Datasheet PDF : 12 Pages
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TK15326
TEST CIRCUITS AND METHODS
SW6
VCC
SW3
SW7
50 kΩ
SW9
SW8
SW4
50 kΩ
1 kHz 10 kHz
1 Vrms 1 Vrms
or ~
~
2 Vrms
+
10 µF
10 kΩ
SW5
+
10 µF
SW2
V~
V_
33 µF +
SW1
THD
+
33 µF
1: The above condition represents 1ch.
VEE
2: The above conditions distortion rate of 1-Ach and dynamic range measurement.
3: SW5 is for residual noise measurement.
4: SW8 is for cross talk (ISO or SEP) measurement.
SUPPLY CURRENT (FIGURE 1)
CONTROL LOW/HIGH LEVEL (FIGURE 2)
This current is a consumption current with a nonloading
condition.
1) Bias supply to Pins 2,4,9,11. (This condition is the same
with other measurements, omitted from the next for
simplicity)
2) Measure the inflow current to Pin 1 from VCC. This current is
the supply current.
This level is to measure the threshold level.
1) Input, the VCC to Pin 1 and input VEE to Pin 12. (This
condition is the same with other measurements, omitted
from the next for simplicity)
2) Input to Pin 4 with sine wave (f = 1 kHz, VIN = 1 Vrms).
3) Connect an oscilloscope to Pin 3.
4) Drop the control voltage gradually from VCC until the
sine wave appears at the oscilloscope. This voltage is
the threshold level when the wave appears.
VCC
A
VCC
+
50 K
50 K
50 K
50 K
VEE
Figure 1
June 1999 TOKO, Inc.
+
~
Cont.
Figure 2
+
VEE
Page 3
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