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GM71CS17800CLT-5 查看數據表(PDF) - Hynix Semiconductor

零件编号
产品描述 (功能)
生产厂家
GM71CS17800CLT-5
Hynix
Hynix Semiconductor Hynix
GM71CS17800CLT-5 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
GM71C17800C
GM71CS17800CL
Capacitance (VCC = 5V+/-10%, TA = 25C)
Symbol
Parameter
Min Max Unit
CI1
Input Capacitance (Address)
-
5
pF
CI2
Input Capacitance (Clocks)
-
7
pF
CI/O
Output Capacitance (Data-In/Out)
-
7
pF
Note: 1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. CAS = VIH to disable DOUT.
Note
1
1
1, 2
AC Characteristics (VCC = 5V+/-10%, TA = 0 ~ +70C, Vss = 0V, Note 1, 2, 18)
Test Conditions
Input rise and fall times : 5 ns
Output timing reference levels : 0.4V, 2.4V
Input timing reference levels : 0.8V, 2.4V
Output load : 2TTL gate + CL (100 pF)
(Including scope and jig)
Read, Write, Read-Modify-Write and Refresh Cycles (Common Parameters)
Symbol
Parameter
GM71C(S)17800 GM71C(S)17800 GM71C(S)17800
C/CL-5
C/CL-6
C/CL-7
Min Max Min Max Min Max
Unit
Note
tRC
Random Read or Write Cycle Time
90 - 110 - 130 - ns
tRP
RAS Precharge Time
30 - 40 - 50 - ns
tCP
CAS Precharge Time
7 - 10 - 10 - ns
tRAS RAS Pulse Width
tCAS CAS Pulse Width
tASR Row Address Set up Time
tRAH Row Address Hold Time
tASC Column Address Set-up Time
tCAH Column Address Hold Time
tRCD RAS to CAS Delay Time
tRAD RAS to Column Address Delay Time
tRSH
RAS Hold Time
tCSH
CAS Hold Time
tCRP CAS to RAS Precharge Time
tODD OE to DIN Delay Time
tDZO OE Delay Time from DIN
tDZC
CAS Delay Time from DIN
tT
Transition Time (Rise and Fall)
50 10,000 60 10,000 70 10,000 ns
13 10,000 15 10,000 18 10,000 ns
0-
0-
0 - ns
7 - 10 - 10 - ns
0-
0-
0 - ns
7 - 10 - 15 - ns
17 45 20 45 20 52 ns
3
12 30 15 30 15 35 ns
4
13 - 15 - 18 - ns
50 - 60 - 70 - ns
5-
5-
5 - ns
13 - 15 - 18 - ns
5
0-
0-
0 - ns
6
0-
0-
0 - ns
6
3 50 3 50 3 50 ns
7
Rev 0.1 / Apr’01

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