12. Test Circuits
12.1. Test Circuits
TLP2105
Fig. 12.1.1 VOL Test Circuit
Fig. 12.1.2 VOH Test Circuit
Fig. 12.1.3 ICCL Test Circuit
Fig. 12.1.4 ICCH Test Circuit
Fig. 12.1.5 IOSL Test Circuit
Fig. 12.1.6 IOSH Test Circuit
Fig. 12.1.7 Switching Time Test Circuit and Waveform
©2016-2019
Toshiba Electronic Devices & Storage Corporation
6
2019-11-19
Rev.2.0