TLP116A(2019) 查看數據表（PDF） - Toshiba
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TLP116A Datasheet PDF : 7 Pages
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Switching Characteristics
(Unless otherwise specified, Ta=-40 to 100°C, VCC=4.5 to 5.5 V)
Characteristic
Symbol
Test
Circuit
Conditions
Min
Typ.
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
IF = 0→12 mA RIN = 100 Ω
—
—
5
CL = 15 pF
IF = 12→0 mA (Note 1)
—
—
Propagation delay time
to logic high output
Propagation delay time
to logic low output
tpHL
tpLH
VIN = 0→5 V
RIN = 470 Ω
—
—
(IF = 0→8 mA) CIN = 27 pF
6
VIN = 5→0 V
CL = 15 pF
(IF = 8→0 mA) (Note 1)
—
—
Switching time dispersion
between ON and OFF
|tpHL-
tpLH|
IF = 12 mA , RIN = 100 Ω,
CL =15 pF (Note 1)
—
—
Output fall time(90-10%)
tf
Output rise time(10-90%)
tr
5
IF = 0→12 mA RIN = 100 Ω
—
15
CL = 15 pF
IF = 12→0 mA (Note 1)
—
15
Common mode transient
immunity at high Level
output
Common mode transient
immunity at low level
output
CMH
CML
VCM = 1000 Vp-p, IF = 0 mA,
Vo(Min) = 4 V, Ta = 25°C
10000 —
7
VCM = 1000 Vp-p, IF = 12 mA,
-10000
—
Vo(Max) = 0.4 V, Ta = 25°C
*All typical values are at Ta=25°C
Note 1: CL is less than 15 pF which includes probe and Jig/stray wiring capacitance.
TLP116A
Max
Unit
60
ns
60
ns
60
ns
60
ns
30
ns
—
ns
—
ns
—
V/μs
—
V/μs
TEST CIRCUIT 1: VOL
IF 1
→
6
VCC
↑
3
0.1 μF
5
VCC
GND 4
VOL IOL
V↑
SHIELD
TEST CIRCUIT 2: VOH
1
6
VCC
5
VO
IOH
V
↑
VCC
0.1 μF
3
GND 4
SHIELD
VOH = VCC - VO
TEST CIRCUIT 3: ICCL
IF
→1
↑
6
ICCL
VCC
A
5 0.1 μF
VCC
3
GND 4
SHIELD
TEST CIRCUIT 4: ICCH
1
6
ICCH
VCC
A
5 0.1 μF
VCC
3
GND 4
SHIELD
© 2019
4
Toshiba Electronic Devices & Storage Corporation
2019-10-10
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