TLP718 查看數據表（PDF） - Toshiba
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TLP718 Datasheet PDF : 9 Pages
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TLP718
Switching Characteristics
(Unless otherwise specified, Ta = −40 to 100°C, VCC = 4.5 to 20 V)
CHARACTERISTIC
TEST
SYMBOL CIRCUIT
CONDITION
MIN TYP. MAX
Propagation delay time
tpLH
to logic HIGH output
IF = 3 → 0 mA
30
120 250
Propagation delay time
to logic LOW output
Switching time dispersion
between ON and OFF
tpHL
|tpHL-
tpLH|
Figure 7,
Figure 8
IF = 0 → 3 mA
―
30
120 250
―
―
220
UNIT
ns
ns
ns
Rise Time (10 – 90 %)
tr
IF = 3 → 0 mA, VCC = 5 V
―
30
―
ns
Fall Time (90 – 10 %)
Common-mode transient
Immunity at HIGH level output
Common-mode transient
Immunity at LOW level output
tf
IF = 0 → 3 mA, VCC = 5 V
―
30
―
CMH
VCM = 1000 Vp-p, IF = 0 mA,
10000
―
―
VCC = 20 V, Ta = 25 °C
Figure 9
CML
VCM = 1000 Vp-p, IF = 5 mA,
−10000
―
―
VCC = 20 V, Ta = 25 °C
ns
V/μs
V/μs
Note: All typical values are at Ta = 25 °C.
Figure 1: VOL TEST CIRCUIT
IF
→
VCC
1
6
↑
2
3
SHIELD
5
GND
4
0.1 μF
VOL IOL Vcc
V↑
Figure 3: ICCL TEST CIRCUIT
IF
→
VCC
1
6
↑
2
5
GND
3
SHIELD
4
ICCL
A
Vcc
0.1 μF
Figure 2: VOH TEST CIRCUIT
1
VF
VCC
6
2
5
GND
3
SHIELD
4
VOH = VCC –VO [V]
VOH IOH
V↑
Vcc
0.1 μF
Figure 4: ICCH TEST CIRCUIT ICCH
VCC
A
1
6
Vcc
2
5 0.1 μF
GND
3
SHIELD
4
Figure 5: IOSL TEST CIRCUIT
IF
→
1
↑
2
3
VCC
6 0.1 μF
A
5 IOSL
Vcc
GND
Vo
SHIELD
4
Figure 6: IOSH TEST CIRCUIT
VCC
1
6 0.1 μF
Vo
A
2
5
IOSH
Vcc
GND
3
SHIELD
4
© 2019
4
Toshiba Electronic Devices & Storage Corporation
2019-06-03
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