TPS851 查看數據表（PDF） - Toshiba

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TPS851

TOSHIBA Photo-IC Silicon Epitaxial Planar

Toshiba 

TOSHIBA Photo-IC Silicon Epitaxial Planar

TPS851

Mobile Phones, PHS

Notebook PCs, PDAs

Video cameras, Digital Still Cameras

Other Equipment Requiring Luminosity Adjustment

TPS851

The TPS851 is an ultra-compact surface-mount photo-IC for

illuminance sensors which incorporates a photodiode and current amp

circuit in a single chip.

The sensitivity is superior to that of a phototransistor, and exhibits

little variation.

It has spectral sensitivity closer to luminous efficiency and excellent

output linearity.

With its ultra-compact surface-mount package, this photo-IC can be

used as the power-saving control for domestic appliances or for

backlighting for displays in cellular phones, this device enables low

power consumption to be achieved.

• Ultra-compact and light surface-mount package:

2.0mm × 2.1mm × 0.7 mm

• Excellent output linearity of illuminance

• Little fluctuation in light current and high level of sensitivity:

• IL = 37 μA to 74 μA @EV = 100 lx using fluorescent light

• Light current variation width = ×1.67 (when light current

classification is specified.)

TOSHIBA

0-2D1

Weight: 0.0054 g (typ.)

• Little temperature fluctuation

• Built-in luminous-efficiency correction function, reduced sensitivity variations due to various light sources:

IL (using incandescent light)/IL (using fluorescent light) = 1.2 (typ.)

• Low supply voltage, making device suitable for battery-powered equipment: VCC = 2.7 V to 5.5 V

Absolute Maximum Ratings (Ta = 25°C)

Characteristics

Symbol

Rating

Unit

Supply voltage

Output voltage

Light current

Permissible power dissipation

VCC

VOUT

IL

P

−0.5 to 7

V

≤ VCC

V

5

mA

35

mW

Operating temperature range

Topr

Storage temperature range

Tstg

Soldering temperature range (Note 1)

Tsol

−30 to 85

°C

−40 to 100

°C

260

°C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even

if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Note 1: The reflow time and the recommended temperature profile are shown in the section entitled Handling

Precautions.

1

2008-07-10

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