UPD70108C 查看數據表（PDF） - NEC => Renesas Technology

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UPD70108C

QUARTERLY MICROPROCESSOR/MICROCOMPUTER RELIABILITY REPORT

NEC => Renesas Technology 

NEC Electronics Inc.

Roseville Manufacturing

Table of Contents

Page

Failure Rate Prediction..................................................................................................... 3

Table 1. Reliability Tests ................................................................................................. 4

Table 2. Reliability Test Results ...................................................................................... 5

Table 3. HTB Life Test Summary and Failure Rate Predictions ..................................... 6

Table 4. Other Life Test Summaries (HTSL, HHSL, T/H) ............................................. 8

Table 5. Environmental and Mechanical Test Summaries (TS, T/C, PCT) .................... 9

Table 6. Failure Summaries ............................................................................................. 10

Table 7. CMOS-4 Process Family, Quarterly Reliability Data (Jan-Mar 99) ................. 11

Table 8. CMOS-5 Process Family, Quarterly Reliability Data (Jan-Mar 99) ................. 11

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