VSC7122 查看數據表（PDF） - Vitesse Semiconductor

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VSC7122

Quad Port Bypass Circuit for 1.0625 Gbit/sec Fibre Channel Arbitrated Loop Disk Arrays

Vitesse Semiconductor 

VITESSE

SEMICONDUCTOR CORPORATION

Advance Product Information

VSC7122

Quad Port Bypass Circuit for 1.0625 Gbit/sec

Fibre Channel Arbitrated Loop Disk Arrays

Absolute Maximum Ratings (1)

TTL Power Supply Voltage, (VDD) ..................................................................................................... 0.5V to +4V

PECL DC Input Voltage, (VINP)............................................................................................. -0.5V to VDD +0.5V

TTL DC Input Voltage, (VINT) ..........................................................................................................-0.5V to 5.5V

DC Voltage Applied to Outputs for High Output State, (VIN TTL)........................................ -0.5V to VDD + 0.5V

TTL Output Current (IOUT), (DC, Output High)........................................................................................... 50mA

PECL Output Current, (IOUT), (DC, Output High) ......................................................................................-50mA

Case Temperature Under Bias, (TC) ............................................................................................... -55° to +125oC

Storage Temperature, (TSTG)......................................................................................................... -65° to + 150oC

Maximum Input ESD .................................................................................................................................. 1500 V

Recommended Operating Conditions(2)

Power Supply Voltage, (VDD) ...........................................................................................................+3.1V to 3.5V

Ambient Operating Temperature Range, (T) .....................................................................................0°C to +70°C

Notes:

1) CAUTION: Stresses listed under “Absolute Maximum Ratings” may be applied to devices one at a time without causing per-

manent damage. Functionality at or above the values listed is not implied. Exposure to these values for extended periods may

affect device reliability.

2) Vitesse guarantees the functional and parametric operation of the part under “Recommended Operating Conditions: except

where specifically noted in the AC and DC Parametric Tables

G52155-0, Rev. 2.1

8/31/98

© VITESSE SEMICONDUCTOR CORPORATION

741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896

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