WM8199SCDS(2003) 查看數據表（PDF） - Wolfson Microelectronics plc
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WM8199SCDS Datasheet PDF : 30 Pages
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WM8199
Test Conditions
AVDD = DVDD1 = 5.0V, DVDD2 = 23.3V, AGND = DGND = 0V, TA = 25°C unless otherwise stated.
PARAMETER
SCK period
SYMBOL
tSPER
TEST CONDITIONS
SCK high
tSCKH
SCK low
tSCKL
SDI set-up time
tSSU
SDI hold time
tSH
SCK to SEN set-up time
tSCE
SEN to SCK set-up time
tSEC
SEN pulse width
tSEW
SEN low to SDO = Register data
tSERD
SCK low to SDO = Register data
tSCRD
SCK low to SDO = ADC data
tSCRDZ
Note:
1.
Parameters are measured at 50% of the rising/falling edge
MIN
41.6
18.8
18.8
6
6
12
12
25
TYP
Production Data
MAX
30
30
30
UNITS
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
w
PD Rev 3.2 November 2003
11
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