WM8777(2005) 查看數據表（PDF） - Wolfson Microelectronics plc
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WM8777 Datasheet PDF : 103 Pages
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WM8777
Pre-Production
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
As per specification IPC/JEDEC J-STD-020B, this product requires specific storage conditions prior to surface mount assembly. It
has a Moisture Sensitivity Level of 3 and as such will be supplied in vacuum-sealed moisture barrier bags, with an out of bag
exposure time limit of 1 week at less than 30°C / 60% RH.
CONDITION
Digital supply voltage
Analogue supply voltage
Voltage range digital inputs (SDIN, SCLK, CSB)
Voltage range digital inputs (MCLK, DIN[3:0], PDATAOPLRC,
PDATAIPLRC and PBCLK)
Voltage range analogue inputs
Master Clock Frequency
Operating temperature range, TA
Storage temperature
Note:
1. Analogue and digital grounds must always be within 0.3V of each other.
MIN
-0.3V
-0.3V
DGND -0.3V
DGND -0.3V
AGND -0.3V
-25°C
-65°C
MAX
+3.63V
+7V
+7V
DVDD + 0.3V
AVDD +0.3V
37MHz
+85°C
+150°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
Digital supply range
DVDD
2.7
Analogue supply range
AVDDDAC,AVDDACD,
4.5
PVDD
Analogue Reference range
VREFP
4.5
Ground
AGNDDAC,
AGNDADC, PGND,
DGND, VREFN
Difference DGND to
-0.3
AGNDDAC/AGNDADC/PLL
GND
TYP
0
0
MAX
3.6
5.5
5.5
+0.3
UNIT
V
V
V
V
w
PP Rev 3.0 January 2004
6
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