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3D7010-400 查看數據表(PDF) - Data Delay Devices

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3D7010-400
Data-Delay-Devices
Data Delay Devices Data-Delay-Devices
3D7010-400 Datasheet PDF : 4 Pages
1 2 3 4
3D7010
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
Period:
PWIN = 1.25 x Total Delay
PERIN = 2.5 x Total Delay
OUTPUT:
Rload:
Cload:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10K
470
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
OUT1
OUT2
DEVICE UNDER OUT3
IN
TEST (DUT)
OUT4
OUT5
OUT6
OUT7
OUT8
OUT9
OUT10
Figure 2: Test Setup
REF
IN
DIGITAL SCOPE/
TRIG TIME INTERVAL COUNTER
tRISE
PWIN
PERIN
tFALL
INPUT
2.4V
VIH
2.4V
SIGNAL
1.5V
0.6V
1.5V
0.6V
VIL
tPLH
tPHL
OUTPUT
SIGNAL
1.5V
VOH
1.5V
VOL
Figure 3: Timing Diagram
Doc #96004
DATA DELAY DEVICES, INC.
4
12/2/96
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com

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