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WS57C43C-35T 查看數據表(PDF) - STMicroelectronics

零件编号
产品描述 (功能)
生产厂家
WS57C43C-35T
ST-Microelectronics
STMicroelectronics ST-Microelectronics
WS57C43C-35T Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
WS57C43C
CAPACITANCE(4) TA = 25°C, f = 1 MHz
SYMBOL
PARAMETER
CONDITIONS
CIN
COUT
CVPP
Input Capacitance
Output Capacitance
VPP Capacitance
VIN = 0V
VOUT = 0V
VPP = 0 V
NOTES: 4. This parameter is only sampled and is not 100% tested.
5.Typical values are for TA = 25°C and nominal supply voltages.
TYP (5)
4
8
18
MAX
6
12
25
UNITS
pF
pF
pF
TEST LOAD (High Impedance Test Systems)
A.C. TESTING INPUT/OUTPUT WAVEFORM
2.01 V
D.U.T.
98
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
3.0
1.5
TEST
1.5
POINTS
0.0
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V
for a logic "0." Timing measurements are made at 1.5 V for
input and output transitions in both directions.
NOTE: 6. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
2-34

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