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74F125 查看數據表(PDF) - NXP Semiconductors.

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74F125
NXP
NXP Semiconductors. NXP
74F125 Datasheet PDF : 12 Pages
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NXP Semiconductors
74F125
Quad buffers; 3-state
8. Recommended operating conditions
Table 5.
Symbol
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Recommended operating conditions
Parameter
Conditions
supply voltage
HIGH-level input voltage
LOW-level input voltage
input clamping current
HIGH-level output current
LOW-level output current
ambient temperature
9. Static characteristics
Min
Typ
Max
Unit
4.5
5.0
5.5
V
2.0
-
-
V
-
-
0.8
V
18
-
-
mA
15
-
-
mA
-
-
64
mA
0
70
C
Table 6. Static characteristics
Symbol Parameter
Conditions
VIK
input clamping voltage VCC = 4.5 V; IIK = 18 mA
VOH
HIGH-level output
voltage
VCC = 4.5 V; VIL = 0.8 V; VIH = 2.0 V
IOH = 3 mA
VCC = 10 %
VCC = 5 %
IOH = 15 mA
VCC = 10 %
VOL
LOW-level output
voltage
VCC = 4.5 V; VIL = 0.8 V; VIH = 2.0 V
IOL = 64 mA
VCC = 10 %
VCC = 5 %
II
input leakage current VCC = 0 V; VI = 7.0 V
IIH
HIGH-level input current VCC = 5.5 V; VI = 2.7 V
IIL
LOW-level input current VCC = 5.5 V; VI = 0.5 V
IOZ
OFF-state output current VCC = 5.5 V
VO = 2.7 V
VO = 0.5 V
IO
output current
VCC = 5.5 V
ICC
supply current
VCC = 5.5 V; VI = GND or VCC
outputs HIGH-state
outputs LOW-state
outputs OFF-state
25 C
Min Typ[1] Max
1.2 0.73 -
-
-
-
- 3.3 -
-
-
-
-
-
-
- 0.42 -
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
[2] -
-
-
- 17 -
- 28 -
- 25 -
0 C to +70 C
Min Max
1.2
-
2.4
-
2.7
-
2.0
-
-
0.55
-
0.55
-
100
-
20
20
-
-
50
225
50
-
100
-
24
-
40
-
35
Unit
V
V
V
V
V
V
A
A
A
A
A
mA
mA
mA
mA
[1] All typical values are measured at VCC = 5 V.
[2] No more than one output should be tested at a time, and the duration of the test should not exceed one second.
74F125
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 18 January 2013
© NXP B.V. 2013. All rights reserved.
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