2N7000, 2N7002
3
Test circuits
Test circuits
Figure 16. Switching times test circuit for
resistive load
Figure 17. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
RL
2200
3.3
µF
µF VDD
IG=CONST
VD
VGS
) RG
D.U.T.
Vi=20V=VGMAX
2200
µF
2.7kΩ
100Ω
D.U.T.
VG
t(s PW
c 47kΩ
du PW
ro AM01468v1
1kΩ
AM01469v1
P Figure 18. Test circuit for inductive load
Figure 19. Unclamped Inductive load test
te switching and diode recovery times
circuit
- Obsole G
uct(s) 25Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100µH
B
3.3
B
µF
D
G
rod RG
S
1000
µF
VDD
Vi
L
VD
2200
3.3
µF
µF
VDD
ID
D.U.T.
P Pw
te AM01470v1
Obsole Figure 20. Unclamped inductive waveform
Figure 21. Switching time waveform
AM01471v1
V(BR)DSS
ton
toff
VD
tdon
tr
tdoff tf
VDD
IDM
ID
0
VDD
90%
10% VDS
90%
VGS
90%
10%
AM01472v1
0
10%
AM01473v1
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