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KBMF01SC6(2004) 查看數據表(PDF) - STMicroelectronics

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KBMF01SC6 Datasheet PDF : 8 Pages
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KBMF
Figure 5: Measurement conditions
ESD
SURGE
16kV
Air
Discharge
TEST BOARD
Vin
Vout
Figure 6: Remaining voltage at both stages S1 (Vinput) and S2 (Voutput) during ESD surge
Positive surge
Negative surge
Please note that the KBMF01SC6 is not only acting for positive ESD surges but also for negative ones.
For these kind of disturbances it clamps close to ground voltage as shown in the Negative Surge figure.
3. LATCH-UP PHENOMENA
The early ageing and destruction of IC’s is often due to latch-up phenomena which is mainly induced by
dV/dt. Thanks to its structure, the KBMF01SC6 provides a high immunity to latch-up phenomena by
smoothing very fast edges.
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