Philips Semiconductors
2-input NAND gate
Product specification
74AHC1G00; 74AHCT1G00
AC CHARACTERISTICS
Type 74AHC1G00
GND = 0 V; tr = tf ≤ 3.0 ns.
SYMBOL PARAMETER
TEST CONDITIONS
WAVEFORMS
CL
(pF)
MIN.
Tamb (°C)
25
−40 to +85 −40 to +125 UNIT
TYP. MAX. MIN. MAX. MIN. MAX.
VCC = 3.0 to 3.6 V; note 1
tPHL/tPLH propagation delay see Figs 5 and 6 15 −
A and B to Y
50 −
4.5 7.9 1.0 9.5 1.0 10.5 ns
6.5 11.4 1.0 13.0 1.0 14.5 ns
VCC = 4.5 to 5.5 V; note 2
tPHL/tPLH propagation delay see Figs 5 and 6 15 −
A and B to Y
50 −
3.5 5.5 1.0 6.5 1.0 7.0 ns
4.9 7.5 1.0 8.5 1.0 9.5 ns
Notes
1. Typical values at VCC = 3.3 V.
2. Typical values at VCC = 5 V.
Type 74AHCT1G00
GND = 0 V; tr = tf ≤ 3.0 ns.
SYMBOL PARAMETER
TEST CONDITIONS
WAVEFORMS
CL
(pF)
MIN.
Tamb (°C)
25
−40 to +85 −40 to +125 UNIT
TYP. MAX. MIN. MAX. MIN. MAX.
VCC = 4.5 to 5.5 V; note 1
tPHL/tPLH propagation delay see Figs 5 and 6 15 −
A and B to Y
50 −
3.6 6.2 1.0 7.1 1.0 8.0 ns
5.0 7.9 1.0 9.0 1.0 10.0 ns
Note
1. Typical values at VCC = 5 V.
2002 May 27
8