74F1240 查看數據表（PDF） - Philips Electronics

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74F1240

Octal inverter buffer (3-State)

Philips Electronics 

Philips Semiconductors

Buffers

Product specification

74F1240, 74F1241*

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

VCC

VIH

VIL

IIK

IOH

IOL

Tamb

Supply voltage

High-level input voltage

Low-level input voltage

Input clamp current

High-level output current

Low-level output current

Operating free-air temperature range

LIMITS

MIN

NOM

MAX

4.5

5.0

5.5

2.0

0.8

–18

–15

64

0

+70

UNIT

V

V

V

mA

mA

mA

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

MIN

TYP MAX

VOH

High-level output voltage

VOL

Low-level output voltage

±10% VCC 2.4

V

VCC = MIN IOH = –3mA

VIL = MAX

±5% VCC

2.7

3.3

V

VIH = MIN

±10% VCC

IOH = –15mA ±5% VCC

2.0

2.0

V

V

VCC = MIN

VIL = MAX

VIH = MIN

IOL = 48mA

IOL = 64mA

±10% VCC

±5% VCC

0.38 0.55

V

0.42 0.55

V

VIK

II

IIH

IIL

IOZH

Input clamp voltage

Input current at maximum input voltage

High-level input current

Low-level input current

Off-state output current,

High-level voltage applied

VCC = MIN, II = IIK

VCC = 0.0V, VI = 7.0V

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 0.5V

VCC = MAX, VO = 2.7V

–0.73 –1.2

V

100

µA

20

µA

–20

µA

50

µA

IOZL

Off-state output current,

Low-level voltage applied

VCC = MAX, VO = 0.5V

–50

µA

IOS

Short-circuit output current3

VCC = MAX

–100

–225 mA

ICCH

22

30

mA

74F1240 ICCL VCC = MAX

58

75

mA

ICC

Supply current (total)

ICCZ

ICCH

44

58

mA

33

44

mA

74F1241 ICCL VCC = MAX

62

80

mA

ICCZ

45

60

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

* Discontinued part. Please see the Discontinued Products List.

1999 Jan 08

5

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