AD7751 查看數據表（PDF） - Analog Devices

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AD7751

Energy Metering IC With On-Chip Fault Detection

Analog Devices 

DISTRIBUTION

16

CHARACTERISTICS

NUMBER OF PTS: 138

MINIMUM: –11.1367

14

MAXIMUM: 10.1775

MEAN: –1.44576

STD DEV: 4.6670

12

GAIN = 1

TEMP = 25؇C

10

8

6

4

2

0

؊15 ؊10 ؊5

0

5

10

15

TPC 12. Channel 1 Offset Distribution (Gain = 1)

21

18

15

12

9

6

3

0

؊15 ؊10 ؊5

0

DISTRIBUTION

CHARACTERISTICS

NUMBER OF PTS: 138

MINIMUM: –7.01774

MAXIMUM: 6.65068

MEAN: –0.421358

STD DEV: 2.974

GAIN = 2

TEMP = 25؇C

5

10

15

TPC 13. Channel 1 Offset Distribution (Gain = 2)

35

30

25

20

15

10

5

0

؊15 ؊10

؊5

0

DISTRIBUTION

CHARACTERISTICS

NUMBER OF PTS: 138

MINIMUM: –5.36107

MAXIMUM: 4.30413

MEAN: 0.346894

STD DEV: 1.86651

GAIN = 8

TEMP = 25؇C

5

10

15

TPC 14. Channel 1 Offset Distribution (Gain = 8)

AD7751

35

30

25

20

15

10

5

0

–15

–10

–5

0

DISTRIBUTION

CHARACTERISTICS

NUMBER OF PTS: 138

MINIMUM: 4.37379

MAXIMUM: –5.08496

MEAN: 0.47494

STD DEV: 1.71819

GAIN = 16

TEMP = 25؇ C

5

10

15

TPC 15. Channel 1 Offset Distribution (Gain = 16)

40A TO

40mA

10␮F

100nF

VDD

100nF

10␮F

RB 1k⍀

33nF

1k⍀

33nF

RB

1k⍀

33nF

931⍀ 33nF

220V

930k⍀

33nF

931⍀

10␮F 100nF

GAIN

1

2

8

16

RB

18.2⍀

8.2⍀

2.2⍀

0.68⍀

AVDD AC/DC AVDD

V1A

F1

U1

AD7751 F2

V1B

CF

REVP

V1N

FAULT

CLKOUT

V2N

CLKIN

V2P

G0

G1

S0

REFIN/OUT

S1

SCF

RESET AGND DGND

VDD

U3

K9

K10

PS2501-1

Y1

22pF

3.58MHz

22pF

GAIN

SELECT

VDD

10k⍀

100nF

100nF 100nF

TPC 16. Test Circuit for Performance Curves

REV. A

–9–

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