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AD1315 查看數據表(PDF) - HANAMICRON

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AD1315 Datasheet PDF : 8 Pages
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AD1315
FUNCTIONAL DESCRIPTION
The AD1315 is a complete high speed active load designed for
use in general purpose instrumentation and digital functional
test equipment. The function of the active load is to provide
independently variable source and sink currents for the device to
be tested.
The equivalent circuit for the AD1315 is shown in Figure 11.
An active load performs the function of loading the output of
the device under test with a programmed IOH or IOL. These
currents are independently programmable. VCOM is the commu-
tation voltage point at which the load switches from source to
sink mode. The active load may also be inhibited, steering cur-
rent to the IOLRTN and IOHRTN pins, effectively disconnecting it
from the test pin.
The AD1315 accepts differential digital signals at its inhibit
inputs ensuring precise timing control and high noise immunity.
The wide inhibit input voltage range allows for ECL power
supplies of –5.2 V and 0 V, –3.2 V and +2 V, and 0 V and +5 V.
Where speed and timing accuracy are less important, TTL or
CMOS logic levels may be used to toggle the Inhibit inputs of
the AD1315. Single ended operation is possible by biasing one
of the inputs to approximately +1.3 V for TTL or VCC/2 for
CMOS. Care should be taken to observe the 4 V maximum
allowable input voltage.
The IOH and IOL programming inputs accept 0 V to +5 V analog
inputs, corresponding to 0 to 50 mA output currents. The VCOM
input, which sets the IOH/IOL switch point, may be set anywhere
within the input range of –2 V to +7 V.
Figure 11. Block Diagram
Figure 12. Allowable Current Range for IOH, IOL vs. VDUT
Ideally, the commutation point set at VCOM would provide in-
stantaneous current sink/source switching. Because of I/V
characteristics of the internal bridge diodes, this is not the case.
To guarantee full current switching at the DUT, at least a 1 volt
difference between VCOM and VDUT must be maintained in
steady state conditions. Because of the relatively fast edge rates
exhibited by typical logic device outputs, this should not be a
problem in normal ATE applications.
INHIBIT MODE LEAKAGE
The AD1315’s inhibit-mode leakage current changes with both
temperature and bias levels. There are two major contributing
effects: transistor reverse-bias collector-base leakage and reverse
leakage in the Schottky-diode bridge. Leakage variations with
VDUT arise primarily from transistor collector-base leakage,
while both effects contribute to leakage current temperature
variations. Inhibit-mode leakage is weakly dependent on VCOM
and decreases slightly as the difference between VDUT and VCOM
is reduced. Figure 8 shows typical AD1315 inhibit leakage cur-
rent as a function of VDUT and temperature.
THERMAL CONSIDERATIONS
The AD1315 is provided in a 0.550" ϫ 0.550", 16-lead (bottom
brazed) gull wing, surface mount package with a θJC of 10°C/W
(typ). Thermal resistance (case-to-ambient) vs. air flow for the
AD1315 in this package is shown in Figure 13. The data pre-
sented is for a ZIF socketed device. For PCB mounted devices
(w/30 mils clearance) the thermal resistance should be ~3 to 7%
lower with air flows below 320 lfm(1). Notice that the improve-
ment in thermal resistance vs. air flow starts to flatten out just
above 400 lfm(2).
NOTES
1Ifm is air flow in linear feet/minute.
2For convection cooled systems, the minimum recommended airflow is 400 lfm.
VDUT VOLTAGE RANGE
In Figure 12, VDUT range, IOH and IOL typical current maxi-
mums are plotted versus DUT voltage. In the IOH mode (VDUT
higher than VCOM), the load will sink 50 mA, until its output
starts to saturate at approximately –1.5 V. In the IOL mode
(VDUT lower than VCOM), the load will source 50 mA until its
output starts to saturate at approximately +5.5 V. At +7 V, the
source current will be close to zero.
Figure 13. Case-to-Ambient Thermal Resistance vs.
Air Flow
–6–
REV. A

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