HT27LC020 查看數據表（PDF） - Holtek Semiconductor
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HT27LC020 Datasheet PDF : 15 Pages
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HT27LC020
D.C. Characteristics
Symbol
Parameter
Read Operation
VOH
Output High Level
VOL
Output Low Level
VIH
Input High Level
VIL
Input Low Level
ILI
Input Leakage Current
ILO
Output Leakage Current
ICC
VCC Active Current
ISB1
Standby Current (CMOS)
ISB2
Standby Current (TTL)
IPP
VPP Read/Standby
Current
Programming Operation
VOH
Output High Level
VOL
Output Low Level
VIH
Input High Level
VIL
Input Low Level
ILI
Input Load Current
VH
A9 Product ID Voltage
ICC
VCC Supply Current
IPP
VPP Supply Current
Capacitance
CIN
Input Capacitance
COUT Output Capacitance
CVPP VPP Capacitance
Test Conditions
VCC
Conditions
3.3V IOH=-0.4mA
3.3V IOL=2.0mA
3.3V
¾
3.3V
¾
3.3V VIN=0 to 3.6V
3.3V VOUT=0 to 3.6V
3.3V
CE=VIL, f=5MHz,
IOUT=0mA
3.3V CE=VCC±0.3V
3.3V CE=VIH
3.3V CE=OE=VIL, VPP=VCC
6V IOH=-0.4mA
6V IOL=2.0mA
6V
¾
6V
¾
6V VIN=VIL, VIH
6V
¾
6V
¾
6V CE=VIL
3.3V VIN=0V
3.3V VOUT=0V
3.3V VPP=0V
Min. Typ. Max. Unit
2.4
¾
¾
V
¾
¾
0.45
V
2.0
¾ VCC+0.5 V
-0.3 ¾
0.8
V
-5
¾
5
mA
-10 ¾
10
mA
¾
¾
15
mA
¾
1.0
10
mA
¾
¾
0.6
mA
¾
¾
100
mA
2.4
¾
¾
V
¾
¾
0.45
V
0.7VCC ¾ VCC+0.5 V
-0.5 ¾
0.8
V
¾
¾
5.0
mA
11.5 ¾
12.5
V
¾
¾
40
mA
¾
¾
10
mA
¾
8
12
pF
¾
8
12
pF
¾
18
25
pF
A.C. Characteristics
Symbol
Parameter
Test Conditions
VCC
Conditions
Read Operation
tACC Address to Output Delay
3.3V CE=OE=VIL
tCE
Chip Enable to Output Delay
3.3V OE=VIL
tOE
Output Enable to Output Delay
3.3V CE=VIL
tDF
CE or OE High to Output Float, Whichever
Occurred First
3.3V
¾
tOH
Output Hold from Address, CE or OE,
Whichever Occurred First
3.3V
¾
Ta=+25°C±5°C
Min. Typ. Max. Unit
¾
¾
90
ns
¾
¾
90
ns
¾
¾
45
ns
¾
¾
40
ns
0
¾
¾
ns
Rev. 1.50
3
December 8, 2003
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